Patents by Inventor Jonathan P. Eshbaugh

Jonathan P. Eshbaugh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8151630
    Abstract: A quantitative fit test (QNFT) system and method for assessing the biological fit factor (FF) performance of respiratory protective devices. The biological QNFT system includes the following three main elements: an aerosol generation system; an exposure chamber; and an aerosol sampling subsystem. The aerosol sampling subsystem includes an aerosol spectrometer that counts particles in discrete size units ranging from 0.5 to 20 micrometers (?m) making it possible to obtain several size-specific FF measurements from a single respirator fit test. A virtual impactor in the aerosol generation system increases the number of challenge particles in the primary target size of interest (1 to 5 ?m) and increases the sensitivity of the method allowing FF values of up to one million to be measured without the need to correct for in-mask background particles.
    Type: Grant
    Filed: November 6, 2009
    Date of Patent: April 10, 2012
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Paul D. Gardner, Jonathan P. Eshbaugh
  • Patent number: 7614280
    Abstract: A quantitative fit test (QNFT) system and method for assessing the biological fit factor (FF) performance of respiratory protective devices. The biological QNFT system includes the following three main elements: an aerosol generation system; an exposure chamber; and an aerosol sampling subsystem. The aerosol sampling subsystem includes an aerosol spectrometer that counts particles in discrete size units ranging from 0.5 to 20 micrometers (?m) making it possible to obtain several size-specific FF measurements from a single respirator fit test. A virtual impactor in the aerosol generation system increases the number of challenge particles in the primary target size of interest (1 to 5 ?m) and increases the sensitivity of the method allowing FF values of up to one million to be measured without the need to correct for in-mask background particles.
    Type: Grant
    Filed: December 20, 2006
    Date of Patent: November 10, 2009
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Paul D. Gardner, Jonathan P. Eshbaugh