Patents by Inventor Jonathan P. Sullivan

Jonathan P. Sullivan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10247703
    Abstract: An exemplary method of inspecting a component includes, among other things, securing an inspection probe body relative to a component, using a sensor assembly housed within the inspection probe body to induce an eddy current in a target area of the component, the target area having a target surface that is spaced from the sensor assembly, sensing a parameter of the eddy current in the component using the sensor assembly, and determining a position of the target surface of the component relative to the inspection probe body using the parameter of eddy current from the sensing.
    Type: Grant
    Filed: December 12, 2016
    Date of Patent: April 2, 2019
    Assignee: United Technologies Corporation
    Inventors: Kevin D. Smith, Jonathan P. Sullivan, David A. Raulerson
  • Publication number: 20170122910
    Abstract: An exemplary method of inspecting a component includes, among other things, securing an inspection probe body relative to a component, using a sensor assembly housed within the inspection probe body to induce an eddy current in a target area of the component, the target area having a target surface that is spaced from the sensor assembly, sensing a parameter of the eddy current in the component using the sensor assembly, and determining a position of the target surface of the component relative to the inspection probe body using the parameter of eddy current from the sensing.
    Type: Application
    Filed: December 12, 2016
    Publication date: May 4, 2017
    Inventors: Kevin D. Smith, Jonathan P. Sullivan, David A. Raulerson
  • Patent number: 9551689
    Abstract: An example inspection probe device includes a sensor assembly configured to induce an eddy current in a component. A probe body houses at least a portion of the sensor assembly such that the portion of the sensor assembly is spaced from a target surface of the component when the probe body is in contact with the component. A controller is used to calculate the location of the target surface relative to the probe body using an eddy current parameter sensed by the sensor assembly.
    Type: Grant
    Filed: February 26, 2010
    Date of Patent: January 24, 2017
    Assignee: United Technologies Corporation
    Inventors: Kevin D. Smith, Jonathan P. Sullivan, David A. Raulerson
  • Publication number: 20110210725
    Abstract: An example inspection probe device includes a sensor assembly configured to induce an eddy current in a component. A probe body houses at least a portion of the sensor assembly such that the portion of the sensor assembly is spaced from a target surface of the component when the probe body is in contact with the component. A controller is used to calculate the location of the target surface relative to the probe body using an eddy current parameter sensed by the sensor assembly.
    Type: Application
    Filed: February 26, 2010
    Publication date: September 1, 2011
    Inventors: Kevin D. Smith, Jonathan P. Sullivan, David A. Raulerson
  • Patent number: D836721
    Type: Grant
    Filed: July 5, 2017
    Date of Patent: December 25, 2018
    Inventors: Jonathan P. Sullivan, Debra S. Sullivan