Abstract: An apparatus may include a memory storing transfer curve information for the 2D FETs obtained by applying bias conditions including a drain-to-source voltage and a gate-to-source voltage to the 2D FETs, and measuring channel currents for the 2D FETs while varying the gate-to-source voltage of the 2D FETs. An apparatus may include a characterization parameter encoder that determines the one or more output characterization parameters as output data of a machine learning model by applying the transfer curve information for the 2D FETs as input data to the machine learning model, wherein the machine learning model has been trained to output the one or more output characterization parameters of the fit function for an input of the transfer curve information for the 2D FETs. A system and methods for training and using the machine learning model are disclosed.