Patents by Inventor Jonathan T. Stern

Jonathan T. Stern has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7162625
    Abstract: The present invention discloses an information handling system that reduces POST time in a boot operation. The information handling system includes a processor, a memory and a BIOS unit. The BIOS also includes memory test pointer and a test block size indicator. During the POST routine, the BIOS tests at least one test block during at least one idle period.
    Type: Grant
    Filed: March 10, 2003
    Date of Patent: January 9, 2007
    Assignee: Dell Products L.P.
    Inventors: Jonathan T. Stern, Marc D. Alexander
  • Patent number: 7000159
    Abstract: A system and method for reducing the amount of time for a boot operation is provided that includes a test management module that divides the memory into multiple test blocks and then selects a limited number of test blocks to test during a boot operation, thereby decreasing the overall amount of memory test time.
    Type: Grant
    Filed: March 10, 2003
    Date of Patent: February 14, 2006
    Assignee: Dell Products L.P.
    Inventors: Jonathan T. Stern, Marc D. Alexander
  • Publication number: 20040181656
    Abstract: The present invention discloses an information handling system that reduces POST time in a boot operation. The information handling system includes a processor, a memory and a BIOS unit. The BIOS also includes memory test pointer and a test block size indicator. During the POST routine, the BIOS tests at least one test block during at least one idle period.
    Type: Application
    Filed: March 10, 2003
    Publication date: September 16, 2004
    Applicant: Dell Products L.P.
    Inventors: Jonathan T. Stern, Marc D. Alexander
  • Publication number: 20040181716
    Abstract: A system and method for reducing the amount of time for a boot operation is provided that includes a test management module that divides the memory into multiple test blocks and then selects a limited number of test blocks to test during a boot operation, thereby decreasing the overall amount of memory test time.
    Type: Application
    Filed: March 10, 2003
    Publication date: September 16, 2004
    Applicant: Dell Products L.P.
    Inventors: Jonathan T. Stern, Marc D. Alexander