Patents by Inventor Jonathan Todd

Jonathan Todd has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9734001
    Abstract: Mechanisms for generating an analysis result about a machine are provided. A device generates a first health management (HM) analysis result regarding a machine based on real-time first sensor information received during a first period of time and on a first version HM analytic model. The device provides, to an off-board device, a plurality of sensor information comprising the real-time first sensor information and that is generated during the first period of time. The device receives a second version HM analytic model that is based at least in part on the plurality of sensor information and fault information that identifies actual faults that have occurred on the machine. The device generates a second HM analysis result regarding the machine based on real-time second sensor information received during a second period of time and on the second version HM analytic model.
    Type: Grant
    Filed: April 10, 2013
    Date of Patent: August 15, 2017
    Assignee: Lockheed Martin Corporation
    Inventors: Sreerupa Das, Amar Patel, Steven McNamara, Jonathan Todd
  • Publication number: 20130268241
    Abstract: Mechanisms for generating an analysis result about a machine are provided. A device generates a first health management (HM) analysis result regarding a machine based on real-time first sensor information received during a first period of time and on a first version HM analytic model. The device provides, to an off-board device, a plurality of sensor information comprising the real-time first sensor information and that is generated during the first period of time. The device receives a second version HM analytic model that is based at least in part on the plurality of sensor information and fault information that identifies actual faults that have occurred on the machine. The device generates a second HM analysis result regarding the machine based on real-time second sensor information received during a second period of time and on the second version HM analytic model.
    Type: Application
    Filed: April 10, 2013
    Publication date: October 10, 2013
    Applicant: Lockheed Martin Corporation
    Inventors: Sreerupa Das, Amar Patel, Steven McNamara, Jonathan Todd
  • Patent number: D592807
    Type: Grant
    Filed: August 18, 2008
    Date of Patent: May 19, 2009
    Assignee: Personnel Hygiene Services Limited of Western Industrial Estate
    Inventors: Jonathan Todd, Carl Richard Cotton
  • Patent number: D681191
    Type: Grant
    Filed: June 1, 2011
    Date of Patent: April 30, 2013
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Kevin Shick, Christopher McCracken, Jonathan Todd