Abstract: An exemplary method protects a delicate device from potential damage from shock or vibration. A material in a liquid state is placed in contact with the delicate device. The liquid material is cooled causing it to transition to a solid state which stabilizes the delicate device in contact with the solid material against shock and vibration. The solid state material is heated causing it to sublimate into a gas thus releasing the delicate device for operation.

Abstract: An exemplary method protects a delicate device from potential damage from shock or vibration. A material in a liquid state is placed in contact with the delicate device. The liquid material is cooled causing it to transition to a solid state which stabilizes the delicate device in contact with the solid material against shock and vibration. The solid state material is heated causing it to sublimate into a gas thus releasing the delicate device for operation.

Abstract: A technique for providing high-contrast images of defects in solar cells and solar panels, by illuminating each cell under inspection with broadband infrared radiation, and then forming an image of radiation that is secularly reflected from the cell. Multi-junction solar cells have a metal backing layer that secularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the solar cell materials are relatively transparent.

Abstract: Chromatic correction of a Fresnel lens is effected by collecting data at multiple detectors arrayed along the optical axis of the lens and then digitally processing data from each detector to obtain multiple sets of image data corresponding to selected tuned wavelengths associated with the multiple detectors, or to obtain composite multi-color image data. Digital processing includes deconvolving data from each detector with a point spread function (PSF) associated with the tuned wavelength of the detector, and thereby enhancing the image derived from the detector. Two possible techniques are also disclosed for deriving sub-band signal data having a wavelength that falls between the tuned wavelengths of adjacent detectors.

Abstract: One embodiment of the present method and apparatus encompasses a method having the steps of: locating a rotateable occulter between a star having at least one planet and a light detector for detecting light from the star and the planet, the rotateable occulter having a central circular obscuration, and a plurality of hypergaussian-shaped petals that are located around the central circular obscuration; substantially blocking on axis light from the star with the central circular obscuration; rotating the occulter such that light from the planet oscillates due to changing azimuthal orientation; synchronizing the light from the planet to orientation of the occulter; and detecting off-axis light from the planet with the light detector.

Abstract: A technique for providing high-contrast images of defects in semiconductor devices and arrays of such devices, by illuminating each semiconductor device under inspection with broadband infrared radiation, and then forming an image of radiation that is specularly reflected from the semiconductor device. Many semiconductor devices and arrays of such devices have a metal backing layer that specularly reflects the illumination back into an appropriately positioned and aligned camera, selected to be sensitive to infrared wavelengths at which the semiconductor device materials are relatively transparent.

Abstract: Apparatus, and a related method, for eliminating the effect of speckle images caused by surface imperfections in a primary mirror of a stellar coronagraph. Depending on their size, mirror imperfections can result in speckles in a field of view that also includes an image of a distant target planet. By generating a traveling surface wave in the mirror surface, and then tuning the spatial wavelength of the surface wave to approximately match that of a surface imperfection, the speckle image corresponding to that surface imperfection is made to twinkle in irradiance. Tuning the traveling surface wave though a wide range of spatial wavelengths causes each speckle image in turn to be identified by twinkling, while the target planetary image remains unvarying. Accordingly, multiple speckles corresponding to different mirror imperfections may be conveniently eliminated by image processing.

Abstract: A method for remote analysis of materials embedded in a frozen surface, such as in the icy surface of a planetary body. A laser on board a spacecraft irradiates the frozen surface and thereby releases materials in a gas cloud, by a process of desorption. The laser wavelength is selected to maximize the release of substances by the desorption process, which does not fragment materials into their elemental components. An infrared (IR) spectrometer on the spacecraft detects thermal emissions from the gas cloud against a background provided by the frozen surface, and can readily identify a variety of organic, inorganic and biological materials from their thermal spectra.

Abstract: A positioning boom disposed between a space-based observatory platform and its instrument payload provides thermal and dynamic isolation as well as fine pointing and momentum control. The inventive system isolates a sensitive payload from a warm, dynamically noisy spacecraft, which includes a sunshield. Isolation is required in terms of dynamics and heat flow, both in terms of the absolute level and its variance (thermal isolation). The present invention provides intrinsic control over momentum buildup (which is due to the separation of the center of pressure from the center of mass). The space-based platform also provides a view (field of regard) to at least half the sky (in the anti-sun direction).

Abstract: Collector optics (70) for an EUV radiation source (10) for collecting EUV radiation (78). The collector optics (70) includes an elliptical dish reflector (72) where light generated at a focal point (76) of the reflector (72) is collected by the reflector (72) and is directed to a collection location (82). A frustal annular reflector (90) is positioned around an outer edge (84) of the dish reflector (72) to collect more of the EUV radiation (78) that may otherwise be lost. The radiation (78) reflected by the annular reflector (90) is directed to a center axicon reflector (94) positioned between the focal point (76) of the dish reflector (72) and the collection location (82) to redirect the radiation (78) reflected by the annular reflector (90) to be within a predetermined collection angle.

Abstract: A collector optic assembly for a EUV radiation source. The collector optic assembly includes an elliptical meniscus having a reflective Si/Mo coating for collecting and reflecting EUV radiation generated by the source. The meniscus is machined from a single piece of silicon. The collector optic assembly further includes a heat exchanger that includes cooling channels through which flows a liquid coolant. The heat exchanger is fabricated from a plurality of machined silicon sections fused together by a glass frit bonding process. The meniscus is fused to a front side of the heat exchanger by a glass frit bonding process. A liquid coolant inlet manifold and a liquid coolant outlet manifold are also each machined from a single silicon block and are mounted to a back side of the heat exchanger.

Abstract: Collector optics (70) for an EUV radiation source (10) for collecting EUV radiation (78). The collector optics (70) includes an elliptical dish reflector (72) where light generated at a focal point (76) of the reflector (72) is collected by the reflector (72) and is directed to a collection location (82). A frustal annular reflector (90) is positioned around an outer edge (84) of the dish reflector (72) to collect more of the EUV radiation (78) that may otherwise be lost. The radiation (78) reflected by the annular reflector (90) is directed to a center axicon reflector (94) positioned between the focal point (76) of the dish reflector (72) and the collection location (82) to redirect the radiation (78) reflected by the annular reflector (90) to be within a predetermined collection angle.

Abstract: A method and apparatus for the inspection of a substrate provides consistent detection of defects such as cracks, differentiates between different types of defects, and, does not excessively heat the substrate. An infrared radiating source produces infrared energy which illuminates the substrate in a uniform manner at an incident angle. An infrared camera collects a portion of the infrared light which is reflected from the substrate. An image is created from the collected light which includes indicia of the defect. The image is examined as the incident angle is varied for changes in the appearance of the indicia.

Abstract: A method and apparatus for the inspection of a substrate provides consistent detection of defects such as cracks, differentiates between different types of defects, and, does not excessively heat the substrate. An infrared radiating source produces infrared energy which illuminates the substrate in a uniform manner at an incident angle. An infrared camera collects a portion of the infrared light which is reflected from the substrate. An image is created from the collected light which includes indicia of the defect. The image is examined as the incident angle is varied for changes in the appearance of the indicia.

Abstract: A method and apparatus for the inspection of a substrate provides consistent detection of defects such as cracks, differentiates between different types of defects, and, does not excessively heat the substrate. An infrared radiating source produces infrared energy which illuminates the substrate in a uniform manner at an incident angle. An infrared camera collects a portion of the infrared light which is reflected from the substrate. An image is created from the collected light which includes indicia of the defect. The image is examined as the incident angle is varied for changes in the appearance of the indicia.

Abstract: A semiconductor-to-metal optical switch or device for power limitation in the infrared spectral region includes two thin semiconductor layers sandwiched between two transparent electrodes. An electrical voltage is applied across the two semiconductor layers to produce an active device for blocking incident light in the 8 to 12 .mu.m spectral region. The material composition and thickness of the two semiconductor layers are such that enough photo-excited electrons are generated in the first semiconductor layer so that the second semiconductor layer undergoes a rapid semiconductor-to-metal transition at a predetermined light intensity. The semiconductor layers remain transparent below the predetermined light intensity and the second layer will become metal-like at a light intensity above a threshold level. Upon becoming metal-like, the second semiconductor layer will block the incident light.