Patents by Inventor Jonathan W. McCallum

Jonathan W. McCallum has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Correlation of test results and test coverage for an electronic device design
    Patent number: 9495489
    Abstract: A device simulation system performs a set of tests by applying, for each test in the set, a corresponding test stimulus to a simulation of the electronic device. In response to each test stimulus, the simulation generates corresponding output information which the device simulation system compares to a specified expected outcome to identify a test result for that test stimulus. In addition, for each test stimulus, the device simulation system generates test coverage information indicating the particular configuration of the simulated electronic device that resulted from the stimulus. The device simulation system correlates the coverage information with the test results to identify correlation rules that indicate potential relationships between test results and configurations of the simulated device.
    Type: Grant
    Filed: June 2, 2014
    Date of Patent: November 15, 2016
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Alan J. Carlin, Hugo M. Cavalcanti, Jonathan W. McCallum, Huy Nguyen
  • CORRELATION OF TEST RESULTS AND TEST COVERAGE FOR AN ELECTRONIC DEVICE DESIGN
    Publication number: 20150347645
    Abstract: A device simulation system performs a set of tests by applying, for each test in the set, a corresponding test stimulus to a simulation of the electronic device. In response to each test stimulus, the simulation generates corresponding output information which the device simulation system compares to a specified expected outcome to identify a test result for that test stimulus. In addition, for each test stimulus, the device simulation system generates test coverage information indicating the particular configuration of the simulated electronic device that resulted from the stimulus. The device simulation system correlates the coverage information with the test results to identify correlation rules that indicate potential relationships between test results and configurations of the simulated device.
    Type: Application
    Filed: June 2, 2014
    Publication date: December 3, 2015
    Applicant: Freescale Semiconductor, Inc.
    Inventors: Alan J. Carlin, Hugo M. Cavalcanti, Jonathan W. McCallum, Huy Nguyen