Patents by Inventor Jonathan Wiebe

Jonathan Wiebe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6541950
    Abstract: The invention is a multipath meter that analyses estimates of parameters associated with a direct signal component and one or more multipath signal components of a signal received by an antenna. The meter analyses the parameter estimates in order to facilitate the select of a location for an antenna, monitor signal quality at an existing antenna site, and/or to determine if satellite failure or some other type of signal failure has occurred. The multipath meter makes available to a user or for analysis information related to the contributions of the direct signal and the multipath signals to the received signal. The information includes estimates of various parameters such as delay, relative amplitude and phase of the direct and multipath signals. The meter calculates a ratio of the amplitudes of the direct and the multipath signals, to determine the severity of the multipath signals and, thus, the signal quality.
    Type: Grant
    Filed: January 23, 2001
    Date of Patent: April 1, 2003
    Assignee: Novatel, Inc.
    Inventors: Bryan Townsend, Jonathan Wiebe, Andy Jakab
  • Publication number: 20020036585
    Abstract: The invention is a multipath meter that analyses estimates of parameters associated with a direct signal component and one or more multipath signal components of a signal received by an antenna. The meter analyses the parameter estimates in order to facilitate the select of a location for an antenna, monitor signal quality at an existing antenna site, and/or to determine if satellite failure or some other type of signal failure has occurred. The multipath meter makes available to a user or for analysis information related to the contributions of the direct signal and the multipath signals to the received signal. The information includes estimates of various parameters such as delay, relative amplitude and phase of the direct and multipath signals. The meter calculates a ratio of the amplitudes of the direct and the multipath signals, to determine the severity of the multipath signals and, thus, the signal quality.
    Type: Application
    Filed: January 23, 2001
    Publication date: March 28, 2002
    Inventors: Bryan Townsend, Jonathan Wiebe, Andy Jakab