Abstract: A conductive via of a semiconductor device includes a relatively small diameter portion extending into an active surface of a fabrication substrate and a corresponding, relatively large diameter portion that extends into a back side of the fabrication substrate. This type of conductive via may be fabricated by forming the relatively small diameter portion before or during BEOL processing, while the large diameter portion of each conductive via may be fabricated after BEOL processing is complete. Electronic devices that include one or more semiconductor devices with such conductive vias are also disclosed.

Abstract: Several embodiments of microelectronic configurations with logic components and associated methods of manufacturing are disclosed herein. In one embodiment, the configuration includes a substrate with a recess, a first die carried by the substrate wherein the die substantially covers the recess, and a logic component carried by the die in a location exposed by the recess. The logic component can be substantially coplanar with the substrate. The die is electrically connected to a terminal on a one side of the substrate, and the logic component is electrically connected to a terminal on an opposite side of the substrate.

Abstract: A conductive via of a semiconductor device includes a relatively small diameter portion extending into an active surface of a fabrication substrate and a corresponding, relatively large diameter portion that extends into a back side of the fabrication substrate. This type of conductive via may be fabricated by forming the relatively small diameter portion before or during BEOL processing, while the large diameter portion of each conductive via may be fabricated after BEOL processing is complete. Electronic devices that include one or more semiconductor devices with such conductive vias are also disclosed.

Abstract: A method for making low cost chip size semiconductor packages (“CSPs”) includes preparing a substrate having a first surface with metal pads and lands thereon, and an opposite second surface having openings in it through which the lands are exposed. A solder mask is formed over the first surface of the substrate, and has apertures in it through which the metal pads are exposed. At least one vent opening is formed through the substrate and solder mask. A semiconductor die is electrically connected to the substrate through the apertures in the solder mask using the “flip chip” connection method. A body of an insulative plastic material is formed on the surface of the solder mask that simultaneously overmolds the die and underfills the space between the solder mask and the die in a single step. Solder balls are attached to the lands through the openings in the second surface of the substrate to serve as package input/output terminals.

Abstract: A novel process for plating a substrate without solder mask wherein the substrate is coated with a polymer catalyst to assist adhesion of conductive metal to the substrate. Next, a first plating mask photopolymer, or plating resist, is coated over the polymer catalyst, a circuit pattern is imaged onto the first plating mask and the first plating mask is developed to reveal windows, or circuit traces, in the first plating mask corresponding to the circuit pattern to be embodied on the substrate. Thereafter, a first conductive material such as copper is plated into the windows, and, thereafter, a second conductive material such as nickel may be plated into the windows on top of the first conductive material. Then, the first plating mask is removed from the substrate, leaving behind the conductive material in the form of the desired circuit pattern.

Abstract: A method of producing multi-layered chip carriers by coating the surface of a base layer with a photosensitive dielectric material which forms a dielectric layer; curing at least a portion of the dielectric layer by exposure to radiation; depositing a catalyst on the cured portion of the dielectric layer to form a sensitized dielectric layer; applying a photoresist layer upon the sensitized dielectric layer; curing at least a portion of the photoresist layer; developing the cured photoresist layer by removing uncured portions, thereby exposing corresponding portions of the underlying sensitized dielectric layer; forming conductors on the exposed dielectric layer; stripping the cured photoresist layer: coating a layer of photosensitive dielectric material upon the cured dielectric layer; and repeating the steps to produce successive layers which form a multi-layer chip carrier having a plurality of conductor layers separated by layers of insulating dielectric material.

Abstract: A method and apparatus improves a distribution of an underfill material (504) applied between a flip chip die (202) and a circuit board (310) at a flip chip site (302) having a solder mask (308). An aperture (304) is formed (806) in the solder mask (308) by removing a predetermined majority of the solder mask (308) from the circuit board (310) within the flip chip site (302) before mounting the flip chip die (202). Then the flip chip die (202) is mounted (810) to the flip chip site (302). The underfill material (504) is then applied (812, 814, 816) such that the underfill material (504) flows into the aperture (304), thus improving the distribution of the underfill material (504).

Abstract: A method of interconnecting circuit modules (30) to mother boards (50) each having a plurality of mating solder pads (32, 52) is available. The solder pads (32, 52) have respective pairs of arms (40, 42) and (54, 56) with a venting channel (36, 58) formed between each pair of arms to vent solder medium when the solder pads are reflowed to interconnect the circuit modules and mother boards.

Abstract: A station (10) in a manufacturing line (12) for the accurate placement of solder balls (30) on a ball grid array package and for the removal of excess solder balls comprises a substrate (4) having an array of solder pads (7), and an adhesion layer (8) on the solder pads.