Patents by Inventor Jong-An LEE

Jong-An LEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10471606
    Abstract: A transfer unit of a test handler includes a base frame, a floating assembly, and an arm part. The base frame includes an inserted portion having a penetration hole. The inserted portion including an upper inserted portion disposed near an upper surface of the inserted portion, a lower portion disposed near a lower portion of the inserted portion and a middle inserted portion disposed between the upper inserted portion and the lower inserted portion. The floating assembly is inserted in the penetration hole of the base frame. The floating assembly includes a floating part, an elastic element, and a coupling element. The floating assembly moves back and forth, to left and right sides, and up and down, or flows within a predetermined angle range in the penetration hole.
    Type: Grant
    Filed: January 19, 2017
    Date of Patent: November 12, 2019
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jong-An Lee, Bum-Sic Kim, Young-Gil Lee, Chea-Geun Lim
  • Patent number: 10157767
    Abstract: An apparatus for picking up one or more semiconductor devices includes a body having an air chamber that communicates with surroundings outside of the body and at least a first supply line through which compressed air is supplied into the air chamber, a pickup cylinder penetrating through the body and movably installed in the body, a suction pad being provided at an end portion of the pickup cylinder, and a power transformer secured to the pickup cylinder and transforming an air pressure of the air chamber to a driving force for driving the pickup cylinder.
    Type: Grant
    Filed: October 25, 2017
    Date of Patent: December 18, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventor: Jong-An Lee
  • Publication number: 20180122682
    Abstract: An apparatus for picking up one or more semiconductor devices includes a body having an air chamber that communicates with surroundings outside of the body and at least a first supply line through which compressed air is supplied into the air chamber, a pickup cylinder penetrating through the body and movably installed in the body, a suction pad being provided at an end portion of the pickup cylinder, and a power transformer secured to the pickup cylinder and transforming an air pressure of the air chamber to a driving force for driving the pickup cylinder.
    Type: Application
    Filed: October 25, 2017
    Publication date: May 3, 2018
    Inventor: Jong-An LEE
  • Publication number: 20170131695
    Abstract: A transfer unit of a test handler includes a base frame, a floating assembly, and an arm part. The base frame includes an inserted portion having a penetration hole. The inserted portion including an upper inserted portion disposed near an upper surface of the inserted portion, a lower portion disposed near a lower portion of the inserted portion and a middle inserted portion disposed between the upper inserted portion and the lower inserted portion. The floating assembly is inserted in the penetration hole of the base frame. The floating assembly includes a floating part, an elastic element, and a coupling element. The floating assembly moves back and forth, to left and right sides, and up and down, or flows within a predetermined angle range in the penetration hole.
    Type: Application
    Filed: January 19, 2017
    Publication date: May 11, 2017
    Inventors: JONG-AN LEE, BUM-SIC KIM, YOUNG-GIL LEE, CHEA-GEUN LIM
  • Patent number: 9573235
    Abstract: A transfer unit of a test handler includes a base frame, a floating assembly, and an arm part. The base frame includes an inserted portion having a penetration hole. The inserted portion including an upper inserted portion disposed near an upper surface of the inserted portion, a lower portion disposed near a lower portion of the inserted portion and a middle inserted portion disposed between the upper inserted portion and the lower inserted portion. The floating assembly is inserted in the penetration hole of the base frame. The floating assembly includes a floating part, an elastic element, and a coupling element. The floating assembly moves back and forth, to left and right sides, and up and down, or flows within a predetermined angle range in the penetration hole.
    Type: Grant
    Filed: May 15, 2013
    Date of Patent: February 21, 2017
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jong-An Lee, Bum-Sic Kim, Young-Gil Lee, Chea-Geun Lim
  • Publication number: 20140030047
    Abstract: A transfer unit of a test handler includes a base frame, a floating assembly, and an arm part. The base frame includes an inserted portion having a penetration hole. The inserted portion including an upper inserted portion disposed near an upper surface of the inserted portion, a lower portion disposed near a lower portion of the inserted portion and a middle inserted portion disposed between the upper inserted portion and the lower inserted portion. The floating assembly is inserted in the penetration hole of the base frame. The floating assembly includes a floating part, an elastic element, and a coupling element. The floating assembly moves back and forth, to left and right sides, and up and down, or flows within a predetermined angle range in the penetration hole.
    Type: Application
    Filed: May 15, 2013
    Publication date: January 30, 2014
    Inventors: JONG-AN LEE, BUM-SIC KIM, YOUNG-GIL LEE, CHEA-GEUN LIM
  • Publication number: 20120249177
    Abstract: A handler tray may include a tray body and a socket. The tray body may be configured to receive an object. The tray body with the object may be transferred to a test board. The tray body may be selectively interposed between the object and the test board to supply a test current from the test board to external terminals of the object. The socket may be formed on the tray body. The socket may electrically make contact with the external terminals of the object. Thus, a pick-up robot and an insert may be unnecessary, so that a test system and method of testing the object may have an optimally available space.
    Type: Application
    Filed: February 23, 2012
    Publication date: October 4, 2012
    Applicant: Samsung Electronics Co., Ltd
    Inventors: Gui-Heum CHOI, Doo-Seob KIM, Jong-An LEE, Young-Gil LEE, Seoung-Su HA, Seung-Hee LEE