Abstract: Provided is a positive electrode active material including a plurality of crystallites A, wherein the plurality of crystallites A has a crystallite long-axis orientation degree DoA represented by Equation 1 below is 0.5 to 1, and a crystallite c-axis orientation degree represented by a cross product value of a c-axis rotation vector Rc of a crystal lattice of a crystallite obtained by electron backscatter diffraction (EBSD) analysis and a position unit vector P? of the crystallite is 0.5 to 1. A proportion of the plurality of crystallites A is 25% to 80% with respect to a total number of crystallites in a cross-section of a positive electrode active material. Further provided is a positive electrode and a lithium secondary battery including the positive electrode active material.

Abstract: A substrate processing apparatus may be utilized, for example, for a horizontally fixed organic material deposition equipment for manufacturing large-area displays. A substrate processing apparatus may include a titanium cooling plate having an upper surface and a lower surface; an electrostatic chuck including a first dielectric layer provided on the lower surface, an electrode layer provided on the first dielectric layer, and a second dielectric layer provided on the first dielectric layer and the electrode layer, and chucking a glass substrate using an electrostatic force; and a yoke plate positioned on the upper surface and chucking a mask using a magnetic force. The titanium cooling plate may further includes a first channel provided from the upper surface, a second channel provided from the first channel, and a titanium cover plate coupled to the first channel. The titanium cooling plate may provide a cooling flow path using the second channel.

Abstract: A processor-implemented method includes receiving, from a mobile device, transmission information corresponding to an audio data transmission associated with an audio data packet loss of one or more audio data packets. The processor determines, based at least in part on the transmission information, a geographic region associated with a wireless communication network transceiver. The processor further determines an average audio data packet loss rate associated with the geographic region and a correlation between the audio data packet loss and at least one key performance indicator (KPI). The KPI is indicative of the audio data transmission. Based at least in part on (i) the average audio data packet loss rate and (ii) the correlation between the audio data packet loss and the at least one KPI, the processor generates a handover instruction comprising at least one threshold value for transitioning control from a first cell channel to a second cell channel.

Abstract: The present disclosure relates to a triphasic metal oxide composite including a nanosheet and a core-shell structure, a photocatalyst including the same, and a method of preparing the same.

Abstract: An X-ray inspection device is disclosed. The present X-ray inspection device includes an X-ray tube, a detector disposed so as to face the X-ray tube, and transfer devices, for simultaneous inspection of at least two objects to be inspected, transferring at least two objects to be inspected to an inspection position between the X-ray tube and the detector.

Abstract: Disclosed is a direct slot cooling system for motors, including a stator configured to expand an inner slot space of a stator core where a coil is wound to form a cooling slot through which a cooling fluid passes; a rotor coupled to a center of the stator to rotate; and a housing coupled to left and right sides of the stator to form a cooling jacket in watertight communication with a cooling slot so that a cooling fluid circulates in the cooling jacket.

Abstract: The present disclosure relates to a composite for hydrogen storage formed through lithiation and a method of preparing the same.

Abstract: A semiconductor package includes a package substrate including: first and second bond finger arrays, each of the first and second finger arrays arranged in a first direction on a surface of the package substrate; a first semiconductor chip disposed on the surface of the package substrate and including a first chip pad array corresponding to the first bond finger array; a second semiconductor chip disposed on the surface of the package substrate and including a second chip pad array corresponding to the second bond finger array; first bonding wires connecting bond fingers of the first bond finger array to chip pads of the first chip pad array; and second bonding wires connecting bond fingers of the second bond finger array to chip pads of the second chip pad array.

Abstract: A device for preventing ingress of floating matters on the free surfaces of a ladle and a tundish, each having a discharge port, during a continuous casting process according to an embodiment of the present invention is configured for installation at the discharge ports of the ladle and the tundish, and comprises: a disc-shaped plate; and a support part installed at the plate and configured to support the plate on a surface around each of the discharge ports of the ladle and the tundish, wherein each of the ratio of the radius of the discharge port of the ladle to the width of the plate and the ratio of the radius of the discharge port of the tundish to the width of the plate has a value equal to or greater than 1.

Abstract: Disclosed is a pharmaceutical composition for preventing or treating severe acute respiratory syndrome coronavirus 2 infection disease, the composition comprising a compound represented by a Chemical Formula 1, or a pharmaceutically acceptable salt thereof, as an active ingredient.

Abstract: Disclosed is a pharmaceutical composition for preventing or treating severe acute respiratory syndrome coronavirus 2 infection disease, the composition comprising a compound represented by a Chemical Formula 1, or a pharmaceutically acceptable salt thereof, as an active ingredient.

Abstract: A semiconductor package includes a package substrate including: first and second bond finger arrays, each of the first and second finger arrays arranged in a first direction on a surface of the package substrate; a first semiconductor chip disposed on the surface of the package substrate and including a first chip pad array corresponding to the first bond finger array; a second semiconductor chip disposed on the surface of the package substrate and including a second chip pad array corresponding to the second bond finger array; first bonding wires connecting bond fingers of the first bond finger array to chip pads of the first chip pad array; and second bonding wires connecting bond fingers of the second bond finger array to chip pads of the second chip pad array.

Abstract: A method for manufacturing a ceramic-coated antibacterial fabric includes adding and mixing a ceramic component, calcium carbonate, a binder, and a dispersant into water, thereby to prepare a ceramic solution; heating the ceramic solution to 110 to 130° C., then immersing a fabric in the heated ceramic solution for 100 to 200 minutes, and then drying the fabric for 100 to 150 minutes at a temperature of 50 to 70° C., thereby to form a first coated ceramic layer on the fabric; and subsequently, heating the ceramic solution to 70 to 90° C., then immersing the fabric having the first coated ceramic layer thereon in the heated ceramic solution for 100 to 200 minutes, and then drying the fabric for 100 to 150 minutes at a temperature of 50 to 70° C., thereby to form a second coated ceramic layer on the first coated ceramic layer on the fabric.

Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Abstract: An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.

Abstract: A substrate inspection system and substrate inspection method for setting an inspection region having a three-dimensional shape and/or a two-dimensional arbitrary shape as a region of interest on an image of a substrate. The substrate inspection method includes: generating and displaying a 2D image of a substrate based on image data acquired from the substrate having an inspection object; receiving first input information including arbitrary point data or line data for setting a region of interest at a plurality of particular positions of the 2D image from a user; and displaying the region of interest corresponding to the point data or the line data as a 2D region of interest having an arbitrary shape in accordance with the first input information.

Abstract: Disclosed are a substrate inspection apparatus and a method for displaying a component in a three-dimensional inspection of a substrate. The substrate inspection apparatus measures a substrate or an inspection target region of interest of the substrate and displays an image of components positioned within the measured region on a display unit. The image of the components displayed on the display unit may be displayed in a predetermined reference direction. The difference between the reference direction and a direction in which the actual component is disposed on the substrate is displayed in the form of a numerical value or a figure. Alternatively, the image of the component in the reference direction and the image of the actually disposed component are simultaneously displayed on a screen, and a user may convert a display method of the image by using a toggle button.

Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Abstract: Disclosed is a method for recovering phenol and acetone from the cracking reaction product of bisphenol-A residue, by which economic feasibility and efficiency may be improved by utilizing a phenol/acetone purification process used for preparing bisphenol-A.