Abstract: A pressurizer valve device comprising: a valve housing disposed in a reactor vessel accommodated in a containment vessel, and having a communication hole through which steam in the reactor vessel is introduced, a discharge hole, through which the steam introduced into an interior of the reactor vessel is discharged to the containment vessel, and a connection hole, through which a control fluid is introduced; and a valve piston disposed to be movable in one direction in the interior of the valve housing, and configured to open and close the communication hole depending on a change in a vessel pressure in the reactor vessel.

Abstract: Disclosed is a direct slot cooling system for motors, including a stator configured to expand an inner slot space of a stator core where a coil is wound to form a cooling slot through which a cooling fluid passes; a rotor coupled to a center of the stator to rotate; and a housing coupled to left and right sides of the stator to form a cooling jacket in watertight communication with a cooling slot so that a cooling fluid circulates in the cooling jacket.

Abstract: Disclosed is a direct slot cooling system for motors, including a stator configured to expand an inner slot space of a stator core where a coil is wound to form a cooling slot through which a cooling fluid passes; a rotor coupled to a center of the stator to rotate; and a housing coupled to left and right sides of the stator to form a cooling jacket in watertight communication with a cooling slot so that a cooling fluid circulates in the cooling jacket.

Abstract: A device for preventing ingress of floating matters on the free surfaces of a ladle and a tundish, each having a discharge port, during a continuous casting process according to an embodiment of the present invention is configured for installation at the discharge ports of the ladle and the tundish, and comprises: a disc-shaped plate; and a support part installed at the plate and configured to support the plate on a surface around each of the discharge ports of the ladle and the tundish, wherein each of the ratio of the radius of the discharge port of the ladle to the width of the plate and the ratio of the radius of the discharge port of the tundish to the width of the plate has a value equal to or greater than 1.

Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Abstract: An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.

Abstract: A substrate inspection system and substrate inspection method for setting an inspection region having a three-dimensional shape and/or a two-dimensional arbitrary shape as a region of interest on an image of a substrate. The substrate inspection method includes: generating and displaying a 2D image of a substrate based on image data acquired from the substrate having an inspection object; receiving first input information including arbitrary point data or line data for setting a region of interest at a plurality of particular positions of the 2D image from a user; and displaying the region of interest corresponding to the point data or the line data as a 2D region of interest having an arbitrary shape in accordance with the first input information.

Abstract: Disclosed are a substrate inspection apparatus and a method for displaying a component in a three-dimensional inspection of a substrate. The substrate inspection apparatus measures a substrate or an inspection target region of interest of the substrate and displays an image of components positioned within the measured region on a display unit. The image of the components displayed on the display unit may be displayed in a predetermined reference direction. The difference between the reference direction and a direction in which the actual component is disposed on the substrate is displayed in the form of a numerical value or a figure. Alternatively, the image of the component in the reference direction and the image of the actually disposed component are simultaneously displayed on a screen, and a user may convert a display method of the image by using a toggle button.

Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Abstract: An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.

Abstract: Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.

Abstract: Disclosed are a substrate inspection apparatus and a method for displaying a component in a three-dimensional inspection of a substrate. The substrate inspection apparatus measures a substrate or an inspection target region of interest of the substrate and displays an image of components positioned within the measured region on a display unit. The image of the components displayed on the display unit may be displayed in a predetermined reference direction. The difference between the reference direction and a direction in which the actual component is disposed on the substrate is displayed in the form of a numerical value or a figure. Alternatively, the image of the component in the reference direction and the image of the actually disposed component are simultaneously displayed on a screen, and a user may convert a display method of the image by using a toggle button.

Abstract: A substrate inspection system and substrate inspection method for setting an inspection region having a three-dimensional shape and/or a two-dimensional arbitrary shape as a region of interest on an image of a substrate. The substrate inspection method includes: generating and displaying a 2D image of a substrate based on image data acquired from the substrate having an inspection object; receiving first input information including arbitrary point data or line data for setting a region of interest at a plurality of particular positions of the 2D image from a user; and displaying the region of interest corresponding to the point data or the line data as a 2D region of interest having an arbitrary shape in accordance with the first input information.