Abstract: The present invention pertains to a device and a method for measuring a via hole of a silicon wafer, wherein it is possible to precisely measure the depth of the via hole without damaging the wafer. Broadband infrared light is radiated to a silicon wafer which has a superior light transmission property, so that the depth of the via hole may be measured from the light which is reflected from each boundary surface of the wafer and the interference signal of reference light. The via hole measuring device according to the present invention includes: a light source unit for generating broadband infrared light; and an interferometer for radiating the light generated from the light source unit to a silicon wafer, so as to measure the depth of a via hole formed on the wafer according to the spectrum period of the interference signal of the light, which is reflected from the silicon wafer.

Abstract: Disclosed is a continuous cultivation system for organic ginseng using multilevel cultivation tables, including a facility including: a rainproof plastic roof, a first sun-shading screen placed on the rainproof plastic roof and allows transmission of an adequate amount of sunlight for cultivation of ginseng, and a second sun-shading screen installed at front, back, and left, and right sides of the facility and that allows air to smoothly pass therethrough; a plurality of multilevel cultivation tables that includes three or more levels of cultivation tables each; a water supply device for uniformly supplying water to the cultivation tables; a ventilation window and an air blowing fan installed on a ceiling of the facility to ventilate an upper portion of the facility; and auxiliary light sources installed under all of the cultivation tables except for lowermost cultivation tables.

Abstract: Provided is a spatial phase shifting interferometer using a multi wavelength. More particularly, provided is a spatial phase shifting interferometer using a multi wavelength capable of more rapidly measuring a precise shape of a measurement object by simultaneously oscillating laser having different wavelengths and passing the oscillated laser through a beam splitter and a lens to analyze an interference fringe of the measurement object.

Abstract: Provided are an absolute position measurement method, an absolute position measurement apparatus, and a scale. The scale includes a scale pattern formed by replacing repeatedly arranged pseudo-random-codes with a sequence of a linear feedback shift register of N stages using a first symbol with first width representing a first state and a second symbol with second width representing a second state. The first is divided into two or more first symbol areas of different structures, and the second symbol is divided into two or more second symbol areas of different structures. There is at least one overlap area in which the first symbol and the second symbol overlap each other to have the same structure.

Abstract: Provided are a thickness measuring apparatus and a thickness measuring method. The thickness measuring method includes irradiating first laser beam of a first wavelength ?1 to a transparent substrate and measuring intensity of first laser beam transmitting the transparent substrate; irradiating second laser beam of a second wavelength ?2 to the transparent substrate and measuring intensity of second laser beam transmitting the transparent substrate; and extracting a rotation angle on a Lissajous graph using the first and second laser beams transmitting the transparent substrate. A phase difference between adjacent rays by multiple internal reflection of the first laser beam and a phase difference between adjacent ray by multiple internal reflection of the second laser beam is maintained at ?/2.

Abstract: Provided are a transparent substrate monitoring apparatus and a transparent substrate monitoring method. The transparent substrate monitoring apparatus includes a light emitting unit emitting light; a double slit disposed on a plane defined in a first direction and a second direction intersecting a propagation direction of incident light and includes a first slit and a second slit spaced apart from each other in the first direction to allow the light to pass therethrough; an optical detection unit measuring an intensity profile or position of an interference pattern formed on a screen plane; and a signal processing unit receiving a signal from the optical detection unit to calculate an optical phase difference or an optical path difference.

Abstract: A display employing a signal transmission scheme using an optical interconnection together with an electrical interconnection is provided. The display includes a screen including a plurality of sub displays configured to display information, a plurality of sub signal processors electrically connected to the plurality of sub displays, the sub signal processors being configured to perform conversion between an optical signal and an electrical signal, and a main signal processor optically connected to at least a portion of the plurality of sub signal processors.

Abstract: The present invention relates to a flame-retardant polyolefin resin containing a blend which comprises 0.1-80 wt % of piperazine metal salts or polymers thereof, 10-80.0 wt % of nitrogen-containing synergists or phosphorus/nitrogen retardants, and 1-50 wt % of inorganic compounds, wherein the sum of the components of the blend is 100 wt %.

Abstract: The present invention pertains to a device and a method for measuring a via hole of a silicon wafer, wherein it is possible to precisely measure the depth of the via hole without damaging the wafer. Broadband infrared light is radiated to a silicon wafer which has a superior light transmission property, so that the depth of the via hole may be measured from the light which is reflected from each boundary surface of the wafer and the interference signal of reference light. The via hole measuring device according to the present invention includes: a light source unit for generating broadband infrared light; and an interferometer for radiating the light generated from the light source unit to a silicon wafer, so as to measure the depth of a via hole formed on the wafer according to the spectrum period of the interference signal of the light, which is reflected from the silicon wafer.

Abstract: Provided is a spatial phase shifting interferometer using a multi wavelength. More particularly, provided is a spatial phase shifting interferometer using a multi wavelength capable of more rapidly measuring a precise shape of a measurement object by simultaneously oscillating laser having different wavelengths and passing oscillated laser through a beam splitter and a lens to analyze an interference fringe of the measurement object.

Abstract: A frequency-stabilized laser apparatus and a method for stabilizing the frequency of a laser are disclosed. A semiconductor laser emits a beam. An external reflector has a resonance frequency and feeds back the emitted beam to the semiconductor laser if the frequency of the emitted beam is equal to the resonance frequency. An interference signal generator generates an interference signal for detecting the wavelength of the emitted beam and a controller detects the wavelength of the beam from the generated interference signal. According to the frequency-stabilized laser apparatus and the method for stabilizing the frequency of the laser, it is possible to stabilize the frequency of the beam emitted from the semiconductor laser and output the beam having the stable frequency for a long period of time.

Abstract: A shape measurement apparatus and method using a laser interferometer are disclosed. The shape measurement apparatus includes a plurality of laser devices, which generate beams, emit a beam of a specific frequency from among the generated beams, and output interference signals for detecting wavelengths of the generated beams, and a controller for detecting the wavelengths of the generated beams from the outputted interference signals, and controlling the laser devices on the basis of the detected wavelengths. The optical unit projects the beam of the laser device on a target object, and generates an interference pattern of the object. Several shutters are closed and opened. If the shutters are closed, they prevent the beam of each laser device to be projected on the optical unit. An image pickup unit captures the interference pattern.

Abstract: A shape measurement apparatus and method using a laser interferometer are disclosed. The shape measurement apparatus includes a plurality of laser devices, which generate beams, emit a beam of a specific frequency from among the generated beams, and output interference signals for detecting wavelengths of the generated beams, and a controller for detecting the wavelengths of the generated beams from the outputted interference signals, and controlling the laser devices on the basis of the detected wavelengths. The optical unit projects the beam of the laser device on a target object, and generates an interference pattern of the object. Several shutters are closed and opened. If the shutters are closed, they prevent the beam of each laser device to be projected on the optical unit. An image pickup unit captures the interference pattern.

Abstract: A frequency-stabilized laser apparatus and a method for stabilizing the frequency of a laser are disclosed. A semiconductor laser emits a beam. An external reflector has a resonance frequency and feeds back the emitted beam to the semiconductor laser if the frequency of the emitted beam is equal to the resonance frequency. An interference signal generator generates an interference signal for detecting the wavelength of the emitted beam and a controller detects the wavelength of the beam from the generated interference signal. According to the frequency-stabilized laser apparatus and the method for stabilizing the frequency of the laser, it is possible to stabilize the frequency of the beam emitted from the semiconductor laser and output the beam having the stable frequency for a long period of time.

Abstract: A substrate conveyance device for fabricating a liquid crystal display device is provided. The substrate conveyance device conveys substrates and aligns substrates without using an additional aligning apparatus. The substrate conveyance device includes an arm that forms a body of the substrate conveyance device, a hand and a mover. The hand, that is movable in a first direction, includes a first end coupled with the arm and an upper surface where a substrate is placed on the upper surface. The hand also has a holder which holds a dummy portion which is at an edge of the substrate. The mover is configured to move the hand.

Abstract: An optical fingerprint input device by where a mark identification is attached to one surface of a prism and reflected by light beams coming from an external light source to be incident on a lens such that erroneous recognition caused by a fingerprint afterimage of water, sweat or oil remaining on the fingerprint contact surface of the prism can be prevented to improve the security of the device, and a visual advertisement can be additionally obtained when a mark identification logo for advertisement is attached on one surface of the prism.

Abstract: An optical fingerprint image input device for a mobile apparatus includes: a plate-shaped fingerprint contact member; a distortion correcting member for correcting distortions; light sources disposed at both sides of the fingerprint contact member, other than an inclined surface or a back light source in a liquid crystal display element; focusing means disposed at an inclined surface side of the distortion correcting member; and an image sensor. In other words, the fingerprint contact member and the distortion correcting member having respective set-up inclined angles are disposed to discern sweat, water or oil and to correct a trapezoidal distortion which is a disadvantage that occurs when a thin fingerprint contact medium is used, and to form a lens system comprised of a cylindrical lens and a spherical lens for adjustment of a ratio of transversal to longitudinal widths of an image.

Abstract: A backlight unit having a supplementary lamp for a smooth starting operation includes multiple light-emitting lamps arranged in one direction on a cover bottom; an inverter printed circuit board (PCB) provided at one rear side or both rear sides of the cover bottom; a first hole provided at a predetermined portion of the inverter PCB; a supplementary lamp provided in the first hole of the inverter PCB; and a second hole provided at a predetermined portion of the cover bottom corresponding to the supplementary lamp.

Abstract: A lamp includes first and second glass tube portions for emitting light, respective one ends of the first and second glass tube portions being bent and connected integrally to each other, first and second electrodes respectively formed at respective other ends of the first and second glass tube portions, and a third electrode formed at the bent portion of the first and second glass tube portions.

Abstract: The present invention provides a system for integrating a linear motion guide and a linear induction motor that can commonly employ a stationary member between the linear induction motor and the linear motion guide so that a complicated connection structure between a conventional linear motion guide and a conventional linear induction motor can be removed. In the system, a stationary unit interconnects a stationary member of the linear motion guide and a stationary member of the linear induction motor, and a movable unit interconnects a movable member of the linear motion guide and a movable member of the linear induction motor. As an existing linear transport device requiring both the linear induction motor and the linear motion guide can be simplified, an installation space of the device can be reduced, device manufacturing and maintenance costs can be reduced, and clean straight-line transport can be implemented.