Patents by Inventor Jong Jun You

Jong Jun You has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240128476
    Abstract: The present disclosure relates to a catalyst for a fuel cell electrode including an active particle which includes a core comprising platinum, a transition metal excluding platinum, and an oxide of a non-transition metal; and a shell disposed on the core and including platinum, wherein the active particle includes platinum and the non-transition metal in a molar ratio of 100:1.80 to 100:4.00, a method of preparing the same, and a fuel cell including the same.
    Type: Application
    Filed: September 29, 2023
    Publication date: April 18, 2024
    Applicant: HYUNDAI MOBIS CO., LTD.
    Inventors: Jung Hoon KIM, Jong Jun PARK, Eun Young YOU, Lim KIM, Sung Chul LEE, Jong Myung LEE, Young Ick CHO
  • Patent number: 11956411
    Abstract: An image signal processor includes a register and a disparity correction unit. The register stores disparity data obtained from a pattern image data that an image senor generates, and the image sensor includes a plurality of pixels, and each of the pixel includes at least a first photoelectric conversion element and a second photoelectric conversion element. The image sensor generates the pattern image data in response to a pattern image located at a first distance from the image sensor. The disparity correction unit corrects a disparity distortion of an image data based on the disparity data to generate a result image data, and the image senor generates the image data by capturing an object.
    Type: Grant
    Filed: September 28, 2022
    Date of Patent: April 9, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Hee Kang, Young-Jun Song, Dong-Ki Min, Jong-Min You, Jee-Hong Lee, Seok-Jae Kang, Taek-Sun Kim, Joon-Hyuk Im
  • Publication number: 20080095211
    Abstract: Provided is a apparatus for testing reliability of a semiconductor sample including: a sample mounting part for mounting the semiconductor sample on an upper center part thereof, and mounting components having an evaluation circuit board at an upper peripheral part thereof; a heating block formed to have a tip shape and mounted on a lower part of the semiconductor sample to maintain a test temperature; a cooling block separated from the heating block and surrounding the heating block to cool the temperature of the components; and a fixing block for raising and lowering the semiconductor sample.
    Type: Application
    Filed: December 14, 2005
    Publication date: April 24, 2008
    Inventors: Jong Jun You, Young Kim, Tae Kim
  • Patent number: 7289712
    Abstract: Provided are a planar optical waveguide and a method of fabricating the same which is adapted to a planar optical component and an optical component for use in a optical communication. The planar optical waveguide includes: a lower cladding layer formed on a substrate, a core formed on the lower cladding layer, a dielectric layer covering the core, and an upper cladding layer formed on the lower cladding layer having the dielectric layer. By forming the dielectric layer having a low refractive index between the core and the clad, a difference of refractive indices between the core and the clad increases so that light is densely focused into the core, thereby forming a single mode having a strong energy to minimize a propagation loss.
    Type: Grant
    Filed: September 28, 2005
    Date of Patent: October 30, 2007
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Tae Hong Kim, Jong Jun You, Hee Kyung Sung
  • Publication number: 20070126430
    Abstract: A system for testing a power durability of a SAW filter includes: a signal generator for generating a continuous wave of an oscillator; a high power amplifier for amplifying a signal applied from the signal generator into a target power level; a power durability tester (PDT) for receiving the amplified signal from the high power amplifier and monitoring a power applied to a SAW filter, and setting a path for monitoring an electrical property through a network analyzer; a power meter for measuring an output signal of the PDT; a controller for changing a path to monitor an electric property of the PDT; the network analyzer for analyzing an electrical property of the SAW filter; a reliability tester for applying a test temperature to the SAW filter and maintaining the applied test temperature; a thermal meter for measuring a temperature of the SAW filter; a temperature controller for controlling a test temperature applied to the reliability tester; and a computer for controlling the signal generator, the power m
    Type: Application
    Filed: November 28, 2006
    Publication date: June 7, 2007
    Inventors: Young-Goo Kim, Jong-Jun You, Hong-Joo Kim
  • Publication number: 20060127022
    Abstract: Provided are a planar optical waveguide and a method of fabricating the same which is adapted to a planar optical component and an optical component for use in a optical communication. The planar optical waveguide includes: a lower cladding layer formed on a substrate, a core formed on the lower cladding layer, a dielectric layer covering the core, and an upper cladding layer formed on the lower cladding layer having the dielectric layer. By forming the dielectric layer having a low refractive index between the core and the clad, a difference of refractive indices between the core and the clad increases so that light is densely focused into the core, thereby forming a single mode having a strong energy to minimize a propagation loss.
    Type: Application
    Filed: September 28, 2005
    Publication date: June 15, 2006
    Inventors: Tae Hong Kim, Jong Jun You, Hee Kyung Sung