Patents by Inventor Jong Koo Kang

Jong Koo Kang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Memory application tester having vertically-mounted motherboard
    Patent number: 7327151
    Abstract: Disclosed is a memory application tester for testing a semiconductor memory device. A plurality of motherboards of the tester are vertically mounted and connected to memory devices to be tested mounted on an interface board via a HiFix board so that a memory application tester may test more memory device simultaneously, and a limit in the trace length due to the integration of the motherboards is effectively solved.
    Type: Grant
    Filed: December 7, 2005
    Date of Patent: February 5, 2008
    Assignee: UniTest Incorporation
    Inventor: Jong Koo Kang
  • Algorithm pattern generator for testing a memory device and memory tester using the same
    Patent number: 7302623
    Abstract: Disclosed is an algorithm pattern generator for testing a memory device. It has a configuration which can optimize a configuration of a memory tester including an address scrambling and a data scrambling in the memory tester for carrying out a test at a memory device module level or a component level.
    Type: Grant
    Filed: August 1, 2005
    Date of Patent: November 27, 2007
    Assignee: Unitest, Inc.
    Inventor: Jong Koo Kang