Patents by Inventor Jong Park KIM

Jong Park KIM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8938120
    Abstract: An image data processing method includes generating a data window comprising N rows and N columns using Bayer data from a pixel array, generating a red (R), green (G), blue (B) data of a center pixel in the data window, detecting an edge region in the data window, detecting a bright region in the data window, adjusting the R, G, B data using a suppressing gain factor if both of the edge region and bright region is detected, and outputting the adjusting R, G, B data as a result of an interpolating process.
    Type: Grant
    Filed: September 21, 2012
    Date of Patent: January 20, 2015
    Assignee: SK Hynix Inc.
    Inventor: Jong Park Kim
  • Patent number: 8531529
    Abstract: A dead pixel compensating apparatus includes, inter alia, a pattern generation unit generating a programmable test pattern including data with respect to at least one dead pixel; a register array storing the test pattern; a dead pixel compensation unit receiving the test pattern stored in the register array and performing a dead pixel compensation algorithm to output compensation data; and a determination unit comparing the test pattern and the compensation data to determine whether or not the dead pixel compensation algorithm has an error, wherein a dead pixel compensation algorithm for compensating for a dead pixel of an image sensor in image data supplied from the image sensor is tested.
    Type: Grant
    Filed: October 14, 2011
    Date of Patent: September 10, 2013
    Assignee: SK Hynix Inc.
    Inventors: Geon Pyo Kim, Jong Park Kim, Myoung Kwan Kim
  • Publication number: 20120105648
    Abstract: A dead pixel compensating apparatus includes, inter alia, a pattern generation unit generating a programmable test pattern including data with respect to at least one dead pixel; a register array storing the test pattern; a dead pixel compensation unit receiving the test pattern stored in the register array and performing a dead pixel compensation algorithm to output compensation data; and a determination unit comparing the test pattern and the compensation data to determine whether or not the dead pixel compensation algorithm has an error, wherein a dead pixel compensation algorithm for compensating for a dead pixel of an image sensor in image data supplied from the image sensor is tested.
    Type: Application
    Filed: October 14, 2011
    Publication date: May 3, 2012
    Applicant: HYNIX SEMICONDUCTOR INC.
    Inventors: Geon Pyo KIM, Jong Park KIM, Myoung Kwan KIM