Abstract: Disclosed is an X-ray diffractometer that precisely analyzes a micro-crystal structure of a specimen by exactly measuring the distance between the specimen and a detector, and the position of the detector and a method of correcting a measurement position of the detector. The X-ray diffractometer includes: an X-ray generator; a first stage on which a specimen is loaded; a detector detecting an incident X-ray projected by the X-ray generator and diffracted by the specimen; a second stage on which the detector is installed; and a moving unit disposed between the second stage and the detector, moving the detector such that an interval between the specimen and the detector is varied.

Abstract: A micro-diffraction system and a method of analyzing a sample using the same are provided. The micro-diffraction system includes an X-ray source, a slit turning an X-ray emitted from the X-ray source into a micro X-ray having a micro-sized spot, a stage on which a sample to be illuminated by the micro X-ray is placed, an observing unit confirming an area of the sample on which the micro X-ray is incident, a detecting unit to detect a diffracted X-ray emitted from the area, a rotating shaft connected to a bottom of the stage and transmitting a rotating force to the stage, a motor assembly which is spaced apart from the rotating shaft and generates the rotating force, a belt transmitting the rotating force produced by the motor assembly to the rotating shaft, a power supply supplying power to the motor assembly and a separating unit separating the stage from one, which does not rotate together with the rotating shaft, of two axes perpendicular to the rotating shaft.

Abstract: Provided is an optical module. The optical module includes an optical element, an optical fiber connected to the optical element, a substrate on which the optical element and the optical fiber are mounted, and a guide groove formed adjacent to an edge of the substrate, perpendicular to the fixing groove and adapted to guide an adhesive for fixing the optical fiber to the fixing groove. The substrate has a fixing groove in which the optical fiber is seated. The optical module can improve optical fiber-fixing reliability, productivity, and the performance of optical communication.

Abstract: An in-situ monitoring system for a bonding process and a method therefor are provided. The monitoring system includes: a light source irradiating rays to a sample; a heating unit heating the sample; a temperature detecting unit detecting the temperature of the sample; a light detecting unit detecting the rays passing through the sample and converting the rays into an image signal; and a controlling unit receiving and outputting the image signal, and transmitting a signal for controlling the light source and the heating unit.