Patents by Inventor Jonghan Jin

Jonghan Jin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10801864
    Abstract: Provided is an absolute position color scale disposed to represent a binary code using a first symbol, having a first width and representing a first state (“HIGH”), and a second symbol having the first width and representing a second state (“LOW”). Each of the first and second symbols is divided into two or more segments having the same structure, and the first symbol has the same shape as the second symbol, but has a color pattern different from a color pattern of the symbol.
    Type: Grant
    Filed: January 8, 2019
    Date of Patent: October 13, 2020
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Jong-Ahn Kim, Jae-Wan Kim, Jae-Yong Lee, Jonghan Jin, Jae-Heun Woo
  • Publication number: 20190250013
    Abstract: Provided is an absolute position color scale disposed to represent a binary code using a first symbol, having a first width and representing a first state (“HIGH”), and a second symbol having the first width and representing a second state (“LOW”). Each of the first and second symbols is divided into two or more segments having the same structure, and the first symbol has the same shape as the second symbol, but has a color pattern different from a color pattern of the symbol.
    Type: Application
    Filed: January 8, 2019
    Publication date: August 15, 2019
    Inventors: Jong-Ahn KIM, Jae-Wan KIM, Jae-Yong LEE, Jonghan JIN, Jae-Heun WOO
  • Patent number: 7898669
    Abstract: The present invention relates to absolute distance measurement method and system using an optical frequency generator. The absolute distance measurement method using the optical frequency generator includes (a) generating a plurality of different stabilized wavelengths by using the optical frequency generator; (b) obtaining an initial estimation value of a distance to be measured by using a frequency sweeping interferometer; (c) analyzing an uncertainty range of the obtained initial estimation value; (d) measuring excess fraction parts of the different wavelengths by analyzing interference signals for each of the wavelengths; (e) determining integer parts for each of the different wavelengths within the uncertainty range of the initial estimation value; and (f) measuring an absolute distance to be measured by using the excess fraction part and the integer parts for each of the different wavelengths.
    Type: Grant
    Filed: October 21, 2008
    Date of Patent: March 1, 2011
    Assignee: Korea Advanced Institute of Science and Technology
    Inventors: Seung Woo Kim, Jonghan Jin, Young Jin Kim
  • Publication number: 20090207418
    Abstract: The present invention relates to absolute distance measurement method and system using an optical frequency generator. The absolute distance measurement method using the optical frequency generator includes (a) generating a plurality of different stabilized wavelengths by using the optical frequency generator; (b) obtaining an initial estimation value of a distance to be measured by using a frequency sweeping interferometer; (c) analyzing an uncertainty range of the obtained initial estimation value; (d) measuring excess fraction parts of the different wavelengths by analyzing interference signals for each of the wavelengths; (e) determining integer parts for each of the different wavelengths within the uncertainty range of the initial estimation value; and (f) measuring an absolute distance to be measured by using the excess fraction part and the integer parts for each of the different wavelengths.
    Type: Application
    Filed: October 21, 2008
    Publication date: August 20, 2009
    Applicant: Korea Advanced Institute of Science and Technology
    Inventors: Seung Woo Kim, Jonghan Jin, Young Jin Kim