Abstract: Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector.

Abstract: Embodiments of the present invention provide a hyperspectral endoscope system, comprising a memory for storing data therein, an endoscope arranged to, in use, receive radiation reflected from a sample and to output wide-field image data and line-scan hyperspectral data corresponding to the sample, a processor coupled to the memory, wherein the processor is arranged, in use, to determine registration information between portions of the wide-field image data, and determine wide-area hyperspectral image data in dependence on the registration information and the line-scan hyperspectral data.

Abstract: Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector.

Abstract: Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector.

Abstract: Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector.

Abstract: Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector.

Abstract: Provided is a sample property detecting apparatus including: a wave source configured to irradiate a wave towards a sample; a detector configured to detect a laser speckle that is generated when the wave is multiple-scattered by the sample, at every time point that is set in advance; and a controller configured to obtain a temporal correlation that is a variation in the detected laser speckle according to time, and to detect properties of the sample in real-time based on the temporal correlation, wherein the detector detects the laser speckle between the sample and the detector or from a region in the detector.

Abstract: An apparatus and method for detecting microbes use laser speckles. The apparatus includes a light source configured to irradiate light into a sample to detect microbes, and a measuring part configured to measure laser speckles, which are formed due to a multiple scattering of the light which is incident into the sample, every reference time and to measure concentration of the microbes contained in the sample based on temporal correlation of the measured laser speckles.

Abstract: An apparatus and method for detecting microbes use laser speckles. The apparatus includes a light source configured to irradiate light into a sample to detect microbes, and a measuring part configured to measure laser speckles, which are formed due to a multiple scattering of the light which is incident into the sample, every reference time and to measure concentration of the microbes contained in the sample based on temporal correlation of the measured laser speckles.