Patents by Inventor Joo Hee PARK

Joo Hee PARK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9927351
    Abstract: A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
    Type: Grant
    Filed: August 12, 2015
    Date of Patent: March 27, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung Ha Park, Sang Bum Park, Beom Seok Lee, Kui Hyun Kim, Joo Hee Park, Kyung Mi Song, Euy Hyun Cho, Ha Na Kim
  • Patent number: 9891174
    Abstract: Disclosed herein are a reactor, a test apparatus, and a test method, which measure, when a material included in a sample acts as an interfering material with respect to estimating a concentration of a target material, a concentration of the interfering material, and correct an estimated concentration of the target material based on the concentration of the interfering material, thereby improving the reliability and accuracy of the concentration of the target material. The reactor includes: a target material detecting chamber in which a first reagent that includes a first material that is activated by a target material is contained; a first material detecting chamber in which a second reagent that includes the target material is contained; an inlet hole into which a sample is injected; and a channel configured to connect the inlet hole, the target material detecting chamber, and the first material detecting chamber to each other.
    Type: Grant
    Filed: December 31, 2015
    Date of Patent: February 13, 2018
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Kui Hyun Kim, Sang Bum Park, Joo Hee Park
  • Publication number: 20170104000
    Abstract: A vertical memory device includes a substrate, a plurality of channels on the substrate and extending in a first direction that vertical to a top surface of the substrate, a plurality of gate lines and a conductive line on the substrate. The gate lines are stacked on top of each other. The gate lines surround the channels. The gate lines are spaced apart from each other along the first direction. The conductive line cuts the gate lines along the first direction. A width of the conductive line is periodically and repeatedly changed.
    Type: Application
    Filed: October 12, 2016
    Publication date: April 13, 2017
    Inventors: Joo-Hee PARK, Jong-Min LEE, Seon-Kyung KIM, Kee-Jeong RHO, Jin-hyun SHIN, Jong-Hyun PARK, Jin-Yeon WON
  • Publication number: 20160187363
    Abstract: Disclosed herein are a reactor, a test apparatus, and a test method, which measure, when a material included in a sample acts as an interfering material with respect to estimating a concentration of a target material, a concentration of the interfering material, and correct an estimated concentration of the target material based on the concentration of the interfering material, thereby improving the reliability and accuracy of the concentration of the target material. The reactor includes: a target material detecting chamber in which a first reagent that includes a first material that is activated by a target material is contained; a first material detecting chamber in which a second reagent that includes the target material is contained; an inlet hole into which a sample is injected; and a channel configured to connect the inlet hole, the target material detecting chamber, and the first material detecting chamber to each other.
    Type: Application
    Filed: December 31, 2015
    Publication date: June 30, 2016
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Kui Hyun Kim, Sang Bum Park, Joo Hee Park
  • Publication number: 20160047740
    Abstract: A sample test method, microfluidic device, and test device efficiently and accurately compensates for interference of an interfering substance present in a sample using optical measurement without addition of a separate reagent for detecting the interfering substance. The sample test method includes: measuring an optical characteristic value of a target substance present in a sample; measuring an optical characteristic value of an interfering substance present in the sample; and determining a concentration of the target substance for which interference of the interfering substance is compensated for based on the optical characteristic value of the interfering substance.
    Type: Application
    Filed: August 12, 2015
    Publication date: February 18, 2016
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Sung Ha PARK, Sang Bum PARK, Beom Seok LEE, Kui Hyun KIM, Joo Hee PARK, Kyung Mi SONG, Euy Hyun CHO, Ha Na KIM