Patents by Inventor Joon Woon Lee
Joon Woon Lee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11848161Abstract: Provided are a multilayer ceramic capacitor and a board having the same, the multilayer ceramic capacitor including: a capacitor body including an active region, which includes a plurality of dielectric layers and a plurality of internal electrodes alternately disposed with respective dielectric layers interposed therebetween, and covers formed on and under the active region, respectively. The multilayer ceramic capacitor further includes external electrodes disposed on the capacitor body so as to be connected to the internal electrodes. Among the internal electrodes, an internal electrode disposed adjacently to one of the covers has at least one cutaway portion within a portion of the internal electrode connected to the external electrode, and the cutaway portion is (at least partially) filled with a dielectric material.Type: GrantFiled: October 4, 2021Date of Patent: December 19, 2023Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Joon Woon Lee, Je Ik Moon
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Patent number: 11742147Abstract: The multilayer ceramic electronic component includes a ceramic body including a dielectric layer; and first and second internal electrodes disposed inside the ceramic body, and disposed to oppose each other with the dielectric layer interposed therebetween. When an average thickness of the dielectric layer is referred to as td and a standard deviation of a thickness of the dielectric layer in each position is referred to as ?td, while an average thickness of the first and second internal electrodes is referred to as te and a standard deviation of a thickness of a pre-determined region of any layer of the internal electrodes in each position is referred to as ?te, a ratio (?te/?td) of the standard deviation of the internal electrodes in each position to the standard deviation of the thickness of the dielectric layer in each position satisfies 1.10??te/?td?1.35.Type: GrantFiled: April 22, 2022Date of Patent: August 29, 2023Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Tae Sung Kim, Hyeong Sik Yun, Woo Chul Shin, Joon Woon Lee
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Patent number: 11636983Abstract: The multilayer ceramic electronic component includes a ceramic body including a dielectric layer; and first and second internal electrodes disposed inside the ceramic body, and disposed to oppose each other with the dielectric layer interposed therebetween. When an average thickness of the dielectric layer is referred to as td and a standard deviation of a thickness of the dielectric layer in each position is referred to as ?td, while an average thickness of the first and second internal electrodes is referred to as to and a standard deviation of a thickness of a pre-determined region of any layer of the internal electrodes in each position is referred to as ?te, a ratio (?te/?td) of the standard deviation of the internal electrodes in each position to the standard deviation of the thickness of the dielectric layer in each position satisfies 1.10??te/?td?1.35.Type: GrantFiled: April 22, 2022Date of Patent: April 25, 2023Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Tae Sung Kim, Hyeong Sik Yun, Woo Chul Shin, Joon Woon Lee
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Publication number: 20220246359Abstract: The multilayer ceramic electronic component includes a ceramic body including a dielectric layer; and first and second internal electrodes disposed inside the ceramic body, and disposed to oppose each other with the dielectric layer interposed therebetween. When an average thickness of the dielectric layer is referred to as td and a standard deviation of a thickness of the dielectric layer in each position is referred to as ?td, while an average thickness of the first and second internal electrodes is referred to as to and a standard deviation of a thickness of a pre-determined region of any layer of the internal electrodes in each position is referred to as ?te, a ratio (?te/?td) of the standard deviation of the internal electrodes in each position to the standard deviation of the thickness of the dielectric layer in each position satisfies 1.10??te/?td?1.35.Type: ApplicationFiled: April 22, 2022Publication date: August 4, 2022Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Tae Sung Kim, Hyeong Sik Yun, Woo Chul Shin, Joon Woon Lee
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Publication number: 20220246358Abstract: The multilayer ceramic electronic component includes a ceramic body including a dielectric layer; and first and second internal electrodes disposed inside the ceramic body, and disposed to oppose each other with the dielectric layer interposed therebetween. When an average thickness of the dielectric layer is referred to as td and a standard deviation of a thickness of the dielectric layer in each position is referred to as ?td, while an average thickness of the first and second internal electrodes is referred to as te and a standard deviation of a thickness of a pre-determined region of any layer of the internal electrodes in each position is referred to as ?te, a ratio (?te/?td) of the standard deviation of the internal electrodes in each position to the standard deviation of the thickness of the dielectric layer in each position satisfies 1.10??te/?td?1.35.Type: ApplicationFiled: April 22, 2022Publication date: August 4, 2022Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Tae Sung Kim, Hyeong Sik Yun, Woo Chul Shin, Joon Woon Lee
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Publication number: 20220208470Abstract: Provided are a multilayer ceramic capacitor and a board having the same, the multilayer ceramic capacitor including: a capacitor body including an active region, which includes a plurality of dielectric layers and a plurality of internal electrodes alternately disposed with respective dielectric layers interposed therebetween, and covers formed on and under the active region, respectively. The multilayer ceramic capacitor further includes external electrodes disposed on the capacitor body so as to be connected to the internal electrodes. Among the internal electrodes, an internal electrode disposed adjacently to one of the covers has at least one cutaway portion within a portion of the internal electrode connected to the external electrode, and the cutaway portion is (at least partially) filled with a dielectric material.Type: ApplicationFiled: October 4, 2021Publication date: June 30, 2022Applicant: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Joon Woon LEE, Je Ik MOON
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Patent number: 11342121Abstract: The multilayer ceramic electronic component includes a ceramic body including a dielectric layer; and first and second internal electrodes disposed inside the ceramic body, and disposed to oppose each other with the dielectric layer interposed therebetween. When an average thickness of the dielectric layer is referred to as td and a standard deviation of a thickness of the dielectric layer in each position is referred to as ?td, while an average thickness of the first and second internal electrodes is referred to as to and a standard deviation of a thickness of a pre-determined region of any layer of the internal electrodes in each position is referred to as ?te, a ratio (?te/?td) of the standard deviation of the internal electrodes in each position to the standard deviation of the thickness of the dielectric layer in each position satisfies 1.10??te/?td?1.35.Type: GrantFiled: March 31, 2020Date of Patent: May 24, 2022Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.Inventors: Tae Sung Kim, Hyeong Sik Yun, Woo Chul Shin, Joon Woon Lee
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Publication number: 20210035740Abstract: The multilayer ceramic electronic component includes a ceramic body including a dielectric layer; and first and second internal electrodes disposed inside the ceramic body, and disposed to oppose each other with the dielectric layer interposed therebetween. When an average thickness of the dielectric layer is referred to as td and a standard deviation of a thickness of the dielectric layer in each position is referred to as ?td, while an average thickness of the first and second internal electrodes is referred to as to and a standard deviation of a thickness of a pre-determined region of any layer of the internal electrodes in each position is referred to as ?te, a ratio (?te/?td) of the standard deviation of the internal electrodes in each position to the standard deviation of the thickness of the dielectric layer in each position satisfies 1.10??te/?td?1.35.Type: ApplicationFiled: March 31, 2020Publication date: February 4, 2021Inventors: Tae Sung Kim, Hyeong Sik Yun, Woo Chul Shin, Joon Woon Lee