Abstract: A system is configured to evaluate a semiconductor device. The system is for irradiating a test target semiconductor device arranged on a test board with a radiation test beam to measure an error value of the test target semiconductor device, wherein the test target semiconductor device includes a reference test target semiconductor device and a general test target semiconductor device, the system for evaluating the semiconductor device derives a reference error value of the reference test target semiconductor device and a reference error value of the general test target semiconductor device, and the reference error value of the general test target semiconductor device is able to be defined as a relative ratio to the reference error value of the reference test target semiconductor device.

Abstract: An on-die thermal sensor includes an integrating analog-digital converter not requiring a negative reference voltage input. The on die thermal sensor includes a band gap unit, an integrating unit and a counting unit. The band gap unit senses a temperature to output a first voltage corresponding to the sensed temperature. The integrating unit integrates a difference between a reference voltage and a comparing voltage to output a second voltage wherein the comparing voltage has a voltage level higher than that of the reference voltage. The counting unit counts clocks of a clock signal input thereto until the second voltage reaches the first voltage, thereby outputting a thermal code corresponding to the voltage level of the first voltage.

Abstract: An on-die thermal sensor includes an integrating analog-digital converter not requiring a negative reference voltage input. The on die thermal sensor includes a band gap unit, an integrating unit and a counting unit. The band gap unit senses a temperature to output a first voltage corresponding to the sensed temperature. The integrating unit integrates a difference between a reference voltage and a comparing voltage to output a second voltage wherein the comparing voltage has a voltage level higher than that of the reference voltage. The counting unit counts clocks of a clock signal input thereto until the second voltage reaches the first voltage, thereby outputting a thermal code corresponding to the voltage level of the first voltage.