Patents by Inventor Joonhul Kim

Joonhul Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SCANNING PROBE MICROSCOPE WITH TILTED SAMPLE STAGE
    Publication number: 20100017920
    Abstract: A scanning probe microscope has a tilting stage on which a sample is mounted. The sample is scanned back and forth with the stage being tilted clockwise during a forward scan and counterclockwise during a reverse scan. A first surface contour of the sample is determined from the response of the probe and the tilt angle of the stage during the forward scan. A second surface contour of the sample is determined from the response of the probe and the tilt angle of the stage during the reverse scan. A final surface contour of the sample is obtained by combining the first and second surface contours.
    Type: Application
    Filed: July 13, 2009
    Publication date: January 21, 2010
    Inventors: San-IL Park, Yong-Seok Kim, Jitae Kim, Joonhul Kim, Hyunwoo Lee