Abstract: A robot cleaner includes a main body, a traveling unit installed in the main body, to move the main body, an ultrasonic sensor to emit an oscillation wave, to receive a reflection wave reflected from an object surface, and to output vibration generated by the oscillation wave and vibration generated by the reception of the reflection wave as an electrical signal, a waveform analyzer to calculate a generation time period of the electrical signal output from the ultrasonic sensor, and a controller to determine information about the object surface based on the calculated generation time period of the electrical signal, and to control movement of the traveling unit based on the information about the object surface.

Abstract: A robot cleaner includes a main body, a traveling unit installed in the main body, to move the main body, an ultrasonic sensor to emit an oscillation wave, to receive a reflection wave reflected from an object surface, and to output vibration generated by the oscillation wave and vibration generated by the reception of the reflection wave as an electrical signal, a waveform analyzer to calculate a generation time period of the electrical signal output from the ultrasonic sensor, and a controller to determine information about the object surface based on the calculated generation time period of the electrical signal, and to control movement of the traveling unit based on the information about the object surface.

Abstract: A microparticle detection apparatus is provided. The microparticle detection apparatus includes a light emitting optical element, a converging optical system disposed in an advancing direction of light emitted from the optical element to converge the light, a particle path located in an advancing direction of the light having passed through the converging optical system so that the particle path intersects the light, a beam blocking unit to block direct light having passed through the particle path, a condensing lens disposed at the rear of the beam blocking unit, and a detector disposed at the rear of the condensing lens to detect light scattered by particles. A focal point of light formed by the optical element and the converging optical system may be located at the rear of the particle path. A focal point of light irradiated to the particles may be different from the introduction position of the particles.

Abstract: A microorganism detection apparatus including a light source unit to irradiate light, a mirror chamber including a light inlet port and a light outlet port, through which the light is introduced and discharged, respectively an inlet port and an outlet port, through which particles are introduced and discharged, respectively, so that light emitted from the particles (emitted particle light) is generated by the light, and an opening, through which the emitted particle light is discharged outside. The mirror chamber has an oval longitudinal section, and is provided at an inside thereof with a mirror. A condensing optical system is disposed in front of the opening outside the opening to condense the emitted particle light discharged through the opening. Condensing efficiency of the fluorescent light condensing optical system is maximized.

Abstract: Provided are a scanning capacitance microscope, which can be very sensitive to a variation of capacitance between a tip and a sample and can make a clear and accurate measurement by preventing stray capacitance, a method of the scanning capacitance microscope, and a recording medium having embodied thereon a program for the method. The scanning capacitance microscope includes: a resonator including a probe having a cantilever and a tip attached to an end of the cantilever, the resonator resonating according to capacitance between the tip of the probe and a sample; an oscillator generating and applying a signal having a variable frequency to the resonator; and a detector detecting a signal generated by the resonator.

Abstract: A mounting mechanism for the probe head of a Scanning Probe Microscope (SPM) includes two dovetail and two right and left threaded pushdown screws, for convenient mounting and clamping of the probe head. After inserting the probe head between the upper and lower dovetails of the z stage, handles of the pushdown screws are turned so that the lower portion of the upper dovetail rail clamp down the probe head. This mounting mechanism using the dovetail rails and pushdown screws ensures rigid mount and convenient use of the probe head at the same time.

Abstract: A mounting mechanism for the probe tip of a Scanning Probe Microscope (SPM) includes a scanner supported by a stationary frame, and a kinematic mechanism supported by the scanner. The kinematic mechanism includes at least three protrusions and at least one magnet. The mounting mechanism for the probe tip also includes a chip mount having a hole, a slot and a flat surface. The chip mount, on being held by the magnet, provides an easy way to mount the probe tip without requiring any tools.

Abstract: A scanning probe microscope uses two different scanners (also called “scanning stages”) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called “x-y scanner”) scans a sample in a plane (also called “x-y plane”), while the other scanner (called “z scanner”) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called “z direction”) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.

Abstract: A scanning probe microscope uses two different scanners (also called “scanning stages”) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called “x-y scanner”) scans a sample in a plane (also called “x-y plane”), while the other scanner (called “z scanner”) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called “z direction”) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.

Abstract: A scanning probe microscope uses two different scanners (also called “scanning stages”) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called “x-y scanner”) scans a sample in a plane (also called “x-y plane”), while the other scanner (called “z scanner”) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called “z direction”) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.

Abstract: A scanning probe microscope uses two different scanners (also called “scanning stages”) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called “x-y scanner”) scans a sample in a plane (also called “x-y plane”), while the other scanner (called “z scanner”) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called “z direction”) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.