Patents by Inventor Joost André KLUGKIST

Joost André KLUGKIST has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11143975
    Abstract: A lithographic apparatus has an object, the object includes: a substrate and optionally a lower layer on the substrate; an upper layer; and an intermediate layer between the upper layer and the substrate, wherein a bond strength between the intermediate layer and the substrate or lower layer is greater than a bond strength between the intermediate layer and the upper layer and the intermediate layer has a Young's Modulus and/or a Poisson ratio within 20% of that of the upper layer.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: October 12, 2021
    Assignee: ASML Netherlands B.V.
    Inventors: Andrey Nikipelov, Vadim Yevgenyevich Banine, Joost André Klugkist, Maxim Aleksandrovich Nasalevich, Roland Johannes Wilhelmus Stas, Sando Wricke
  • Publication number: 20210132517
    Abstract: A lithographic apparatus has an object, the object includes: a substrate and optionally a lower layer on the substrate; an upper layer; and an intermediate layer between the upper layer and the substrate, wherein a bond strength between the intermediate layer and the substrate or lower layer is greater than a bond strength between the intermediate layer and the upper layer and the intermediate layer has a Young's Modulus and/or a Poisson ratio within 20% of that of the upper layer.
    Type: Application
    Filed: November 27, 2017
    Publication date: May 6, 2021
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Andrey NIKIPELOV, Vadim Yevgenyevich BANINE, Joost André KLUGKIST, Maxim Aleksandrovich NASALEVICH, Roland Johannes Wilhelmus STAS, WRICKE Sandro
  • Patent number: 10976196
    Abstract: A sensor mark including: a substrate having: a deep ultra violet (DUV) radiation absorbing layer including a first material which substantially absorbs DUV radiation; and a protecting layer including a second material, wherein: the DUV radiation absorbing layer has a through hole in it; the protecting layer is positioned, in plan, in the through hole and the protecting layer in the through hole has a patterned region having a plurality of through holes; and the second material is more noble than the first material.
    Type: Grant
    Filed: February 15, 2018
    Date of Patent: April 13, 2021
    Assignee: ASML Netherlands B.V.
    Inventors: Joost André Klugkist, Vadim Yevgenyevich Banine, Johan Franciscus Maria Beckers, Madhusudhanan Jambunathan, Maxim Aleksandrovich Nasalevich, Andrey Nikipelov, Roland Johannes Wilhelmus Stas, David Ferdinand Vles, Wilhelmus Jacobus Johannes Welters, Sandro Wricke
  • Publication number: 20200064183
    Abstract: A sensor mark including: a substrate having: a deep ultra violet (DUV) radiation absorbing layer including a first material which substantially absorbs DUV radiation; and a protecting layer including a second material, wherein: the DUV radiation absorbing layer has a through hole in it; the protecting layer is positioned, in plan, in the through hole and the protecting layer in the through hole has a patterned region having a plurality of through holes; and the second material is more noble than the first material.
    Type: Application
    Filed: February 15, 2018
    Publication date: February 27, 2020
    Applicant: ASML NETHERLANDS B.V.
    Inventors: Joost André KLUGKIST, Vadim Yevgenyevich BANINE, Johan Franciscus Maria BECKERS, Madhusudhanan JAMBUNATHAN, Maxim Aleksandrovich NASALEVICH, Andrey NIKIPELOV, Roland Johannes Wilhelmus STAS, David Ferdinand VLES, Wilhelmus Jacobus Johannes WELTERS, Sandro WRICKE
  • Publication number: 20180299792
    Abstract: A method of forming a radiation filter for a lithographic system, the method including forming at least one structure in or on a filter body, wherein the at least one structure provides a filtering effect and least one of a), b), c) or d): a) the at least one structure includes a plurality of transmissive, reflective, absorbing or fluorescent structures, and the method includes providing a desired distribution of the structures to provide a desired filtering effect; b) forming the at least one structure includes forming at least one transmissive, absorbing, reflective or fluorescent layer that has a variable thickness; c) forming the at least one structure includes altering at least one optical property to provide a variation of the optical property with position; d) the at least one structure includes a fluorescent layer that provides variation of at least one fluorescence property with position and/or angle of incidence.
    Type: Application
    Filed: May 4, 2016
    Publication date: October 18, 2018
    Applicant: ASML Netherlands B.V.
    Inventors: Jelte Rients BEARDA, Joost André KLUGKIST, Robbert Jan VOOGD, Guido HERGENHAN, Meik PANITZ, Jochen TAUBERT