Abstract: A phase plate for high precision wavelength extraction can include a planar substrate which has a point spread function engineered profile formed of a tessellation of regions. The point spread function engineered profile transforms a point spread function of a light source to form a wavelength dependent geometric pattern. The geometric pattern can also preserve spatial location information of the light source. Such a phase plate permits extracting three-dimensional position and the wavelength of a point emitter.

Abstract: A phase plate for high precision wavelength extraction can include a planar substrate which has a point spread function engineered profile formed of a tessellation of regions. The point spread function engineered profile transforms a point spread function of a light source to form a wavelength dependent geometric pattern. The geometric pattern can also preserve spatial location information of the light source. Such a phase plate permits extracting three-dimensional position and the wavelength of a point emitter.

Abstract: A microscopy system which includes a light source for illuminating a sample; an objective lens for capturing light emitted from the illuminated sample to form a signal beam; and a dispersive optical element through which the signal beam is directed, wherein the dispersive optical element converts the signal beam to a spatially coherent signal beam.

Abstract: A microscopy system which includes a light source for illuminating a sample; an objective lens for capturing light emitted from the illuminated sample to form a signal beam; and a dispersive optical element through which the signal beam is directed, wherein the dispersive optical element converts the signal beam to a spatially coherent signal beam.

Abstract: Methods and systems for operating an apertureless microscope for observing one or more features to a molecular sensitivity on objects are described. More particularly, the method includes moving a tip of a probe coupled to a cantilever in a vicinity of a feature of a sample, which emits one or more photons at a detected rate relative to a background rate of the sample based upon the presence of the tip of the probe in the vicinity of the feature. The method modifies the detected rate of the feature of the sample, whereupon the modifying of the detected rate causes the feature of the sample to enhance relative to background rate of the feature.