Patents by Inventor Jordan Peeples

Jordan Peeples has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Devices and methods for sensor data analysis of transient errors
    Patent number: 12681470
    Abstract: A sensor analysis system for monitoring operation of a turbine engine of a power plant, the sensor analysis system including a turbine control system configured to monitor a plurality of sensors, a sensor device configured to monitor operation of the turbine engine and transmit a first analog signal, and a sensor analysis device coupled to the sensor device. The sensor analysis device is configured to receive the first analog signal, capture a first plurality of samples from the first analog signal at a first rate defined by a device sampling period, determine a second rate defined by the device sampling period, capture a second plurality of samples from the first analog signal at the second rate, and detect one or more samples of the second plurality of samples that includes a transient signal above or below a threshold value.
    Type: Grant
    Filed: April 27, 2023
    Date of Patent: July 14, 2026
    Assignee: GE Vernova Infrastructure Technology LLC
    Inventors: Jordan Peeples, Brian E. Lindholm
  • DEVICES AND METHODS FOR SENSOR DATA ANALYSIS OF TRANSIENT ERRORS
    Publication number: 20240361758
    Abstract: A sensor analysis system for monitoring operation of a turbine engine of a power plant, the sensor analysis system including a turbine control system configured to monitor a plurality of sensors, a sensor device configured to monitor operation of the turbine engine and transmit a first analog signal, and a sensor analysis device coupled to the sensor device. The sensor analysis device is configured to receive the first analog signal, capture a first plurality of samples from the first analog signal at a first rate defined by a device sampling period, determine a second rate defined by the device sampling period, capture a second plurality of samples from the first analog signal at the second rate, and detect one or more samples of the second plurality of samples that includes a transient signal above or below a threshold value.
    Type: Application
    Filed: April 27, 2023
    Publication date: October 31, 2024
    Inventors: Jordan Peeples, Brian E. Lindholm