Abstract: Light source device comprising a light source and an optical component, wherein the optical component comprises a receiving section for receiving light from the light source and an emitting section for emitting light, wherein the light source is a non-coherent light source and is adapted to emit light from a two-dimensional region and wherein the optical component is adapted to guide the light from the receiving section to the emitting section such that the light can be emitted in a one dimensional pattern at the emitting section.

Abstract: Light source device comprising a light source and an optical component, wherein the optical component comprises a receiving section for receiving light from the light source and an emitting section for emitting light, wherein the light source is a non-coherent light source and is adapted to emit light from a two-dimensional region and wherein the optical component is adapted to guide the light from the receiving section to the emitting section such that the light can be emitted in a one dimensional pattern at the emitting section.

Abstract: A super-resolution microscopy method includes forming an image of an emitting particle in a detection plane of a detector by a microscopy imaging system and correcting, by a wavefront-modulating device, at least some of the optical defects present between the emitting particle and the detection plane. The method further includes introducing, via the wavefront-modulating device, a deformation of the wavefront emitted by the emitting particle, of variable amplitude, allowing a bijective relationship to be formed between the shape of the image of the emitting particle in the detection plane and the axial position of the emitting particle relative to an object plane that is optically conjugated with the detection plane by the microscopy imaging system. The method further includes controlling the amplitude of the deformation of the wavefront by controlling the wavefront-modulating device, as a function of the given range of values of the axial position of the particle.

Abstract: A super-resolution microscopy method includes forming an image of an emitting particle in a detection plane of a detector by a microscopy imaging system and correcting, by a wavefront-modulating device, at least some of the optical defects present between the emitting particle and the detection plane. The method further includes introducing, via the wavefront-modulating device, a deformation of the wavefront emitted by the emitting particle, of variable amplitude, allowing a bijective relationship to be formed between the shape of the image of the emitting particle in the detection plane and the axial position of the emitting particle relative to an object plane that is optically conjugated with the detection plane by the microscopy imaging system. The method further includes controlling the amplitude of the deformation of the wavefront by controlling the wavefront-modulating device, as a function of the given range of values of the axial position of the particle.