Patents by Inventor Jorg Beersiek

Jorg Beersiek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6326589
    Abstract: A method for treating materials with plasma-inducing high-energy radiation, especially laser radiation, where an area of vapor capillaries (13) of a work piece (10) is observed with a depth definition detecting device over the entire thickness of the work piece and time-dependent measurement of plasma radiation intensity is carried out. In order to accurately monitor the quality of material treatment, the method is implemented in such a way that the momentary plasma intensities are measured at no less than two measurement points which are parallel to an axis (11) of inducing radiation (12). Predetermined capillary parameters are assigned to the measured plasma intensities and control of the material treatment is conducted depending on the capillary geometric parameters.
    Type: Grant
    Filed: March 17, 2000
    Date of Patent: December 4, 2001
    Assignee: Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
    Inventors: Jorg Beersiek, Wolfgang Schulz
  • Patent number: 5869805
    Abstract: A process for material working with plasma induced by high-energy radiati especially laser radiation, in which the radiation originating from the region of the workpiece is observed along the axis of the laser radiation focused along the axis on the workpiece as a function of the time. To obtain a measure of the penetration depth of the vapor capillary in the workpiece the process is so carried out that exclusively the cross section of the vapor capillary is observed with a depth of field encompassing the entire workpiece thickness, and that the mean value of the intensity of the plasma radiation is used as a measure of the penetration depth.
    Type: Grant
    Filed: June 5, 1997
    Date of Patent: February 9, 1999
    Assignee: Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V.
    Inventors: Eckhard Beyer, Jorg Beersiek, Wolfgang Schulz, Holger Nitsch, Peter Abels