Patents by Inventor Jorg Forstner

Jorg Forstner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning probe in pulsed-force mode, digital and in real time
    Publication number: 20070114406
    Abstract: Microscope, in particular a scanning probe microscope, comprising a programmable logic device
    Type: Application
    Filed: October 23, 2006
    Publication date: May 24, 2007
    Applicant: Witec Wissenschaftliche Instrumente und Technologie GmbH
    Inventors: Peter Spizig, Detlef Sanchen, Jorg Forstner, Joachim Koenen, Othmar Marti, Gerhard Volswinkler
  • Scanning probe with digitised pulsed-force mode operation and real-time evaluation
    Publication number: 20040084618
    Abstract: The invention relates to a method for creating the image of a sample surface to be analysed, with a resolution which is better than 1 &mgr;m laterally in relation to the sample surface and better than 100 nm vertically in relation to said surface. According to the invention, the surface is scanned on a point-by-point basis by a scanning probe, the distance between the scanning probe and the sample surface at each scanning point being periodically modulated, in such a way that a force-time curve of the probe is produced for this point. The force-time curve is recorded at each scanning point, digitised using an A/D converter, evaluated online in real-time and stored, together with the entire data stream, in a first area of a memory device.
    Type: Application
    Filed: December 1, 2003
    Publication date: May 6, 2004
    Inventors: Peter Spizig, Detlef Sanchen, Jorg Forstner, Joachim Koenen, Othmar Marti