Patents by Inventor Jorg-Oliver Weidner

Jorg-Oliver Weidner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated semiconductor structure for reliability tests of dielectrics
    Patent number: 6995027
    Abstract: A test structure for assessing the reliability of a dielectric of a circuit element in an integrated circuit includes a plurality of test circuit elements and a plurality of contact pads, wherein at least some of the test circuit elements share one or more of the contact pads. In this way, a failure event can be detected with a reduced number of contact pads, thereby significantly reducing the area of floor space occupied by the test structure.
    Type: Grant
    Filed: August 27, 2003
    Date of Patent: February 7, 2006
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Karsten Wieczorek, Rolf Geilenkeuser, Jörg-Oliver Weidner
  • Integrated semiconductor structure for reliability tests of dielectrics
    Publication number: 20040188678
    Abstract: A test structure for assessing the reliability of a dielectric of a circuit element in an integrated circuit includes a plurality of test circuit elements and a plurality of contact pads, wherein at least some of the test circuit elements share one or more of the contact pads. In this way, a failure event can be detected with a reduced number of contact pads, thereby significantly reducing the area of floor space occupied by the test structure.
    Type: Application
    Filed: August 27, 2003
    Publication date: September 30, 2004
    Inventors: Karsten Wieczorek, Rolf Geilenkeuser, Jorg-Oliver Weidner