Abstract: In a method for initializing at least one electronic circuit unit of an electric circuit, a supply voltage is applied to a power supply connection unit of the electronic circuit in order to supply electrical power to the electronic circuit unit. A reference signal is applied to the electronic circuit unit via a reference signal connection unit. A blocking unit connected to the reference signal connection unit blocks the electronic circuit unit until the reference signal is supplied. An input signal to the electronic circuit unit is supplied via an input signal connection unit of the electronic circuit and an output signal is output by an output signal connection unit of the electronic circuit. The output signal is dependent on the input signal and the reference signal supplied to the electronic circuit unit.

Abstract: In a method for initializing at least one electronic circuit unit of an electric circuit, a supply voltage is applied to a power supply connection unit of the electronic circuit in order to supply electrical power to the electronic circuit unit. A reference signal is applied to the electronic circuit unit via a reference signal connection unit. A blocking unit connected to the reference signal connection unit blocks the electronic circuit unit until the reference signal is supplied. An input signal to the electronic circuit unit is supplied via an input signal connection unit of the electronic circuit and an output signal is output by an output signal connection unit of the electronic circuit. The output signal is dependent on the input signal and the reference signal supplied to the electronic circuit unit.

Abstract: A field effect semiconductor comprises a semiconductor layer having a surface, a first and a second semiconductor region in the semiconductor layer, which are arranged next to one another at the surface of the semiconductor layer, an insulating layer between the first semiconductor region and the second semiconductor region, a semiconductor strip on the surface of the semiconductor layer, which semiconductor strip overlaps the first semiconductor region and the second semiconductor region and adjoins these. A gate overlaps the semiconductor strip at least in the region of the insulating layer. A gate dielectric insulates the gate from the semiconductor strip the first semiconductor region and the second semiconductor region. The semiconductor strip and the gate being formed such that the semiconductor strip is electrically insulating at a first predetermined gate voltage and is electrically conductive at a second predetermined gate voltagero.

Abstract: A test system and a method for testing an integrated circuit determines the synchronization of the integrated circuit by a current measurement rather than conventionally in the time domain. The present principle is based on the insight that the current consumption of a DUT given simultaneous driving of data on a common data channel from the DUT and from the tester is dependent on a superposition of both signals. Accordingly, highly accurate conclusions about the phase angle of the two signals with respect to one another can be drawn from the present current consumption. The principle presented can be applied particularly to DDR-SDRAMs with a low outlay.

Abstract: A test system and a method for testing an integrated circuit determines the synchronization of the integrated circuit by a current measurement rather than conventionally in the time domain. The present principle is based on the insight that the current consumption of a DUT given simultaneous driving of data on a common data channel from the DUT and from the tester is dependent on a superposition of both signals. Accordingly, highly accurate conclusions about the phase angle of the two signals with respect to one another can be drawn from the present current consumption. The principle presented can be applied particularly to DDR-SDRAMs with a low outlay.