Abstract: In accordance with a first aspect of the present disclosure, a storage device is provided, comprising: one or more special function registers; a preloading stage comprising a first preload register, wherein the preloading stage is configured to preload data in the first preload register before loading the preloaded data into the special function registers; wherein the preloading stage is further configured to perform a verification of the integrity of the preloaded data before loading said preloaded data into the special function registers. In accordance with a second aspect of the present disclosure, a corresponding method of operating a storage device is conceived.

Abstract: A controller for a one-time-programmable (OTP) memory is configured to, in response to a write request to program a single bit of an OTP value to the OTP memory, program a bit of the OTP value in the OTP memory, generate a set of PCBs corresponding to the OTP value, and program the PCBs into the OTP memory. Each PCB of the set of PCBs is generated as a logic function of a different subset of bits of the OTP value. The logic function only results in each PCB being programmed or remaining programmed in the OTP memory but not cleared. The OTP controller may be configured to, in response to the write request, program both the bit of the OTP value and a redundant bit, in which the set of PCBs includes a first PCB based on the bit and a second PCB based on the redundant bit.

Abstract: A fault detection system includes a state register, an error detection code (EDC) register, logic circuitry, an EDC generator, and an EDC checker. The state and EDC registers store first reference data and first checksum data, respectively. The logic circuitry executes a logic function based on the first reference data to iteratively generate second reference data that is different from the first reference data, and updates the first reference data of the state register with the second reference data of one iteration. The EDC generator iteratively generates second checksum data based on the iteratively generated second reference data and updates the first checksum data of the EDC register with the second checksum data of one iteration. The EDC checker detects a fault in the IC based on the updated first reference data and the updated first checksum data.

Abstract: An integrated circuit (IC) that includes an always-on buffer and a power line is provided. The power line is routed on the IC such that a first end of the power line is at a first global supply voltage and a second end of the power line is at a second global supply voltage that is less than the first global supply voltage. The always-on buffer receives an input bit and the second global supply voltage and generates an output bit that has a same logic state as that of the input bit. During a fault injection attack, the second global supply voltage is altered such that the logic state of the output bit toggles while the logic state of the input bit remains same. Based on the toggling of the logic state of the output bit, the fault injection attack on the IC is detected.

Abstract: A method and apparatus are described for OTP control logic with randomization for sensing and writing fuse values. In an embodiment, OTP control logic has an address counter to determine an address of a fuse to be read from an OTP fuse box and a corresponding address of a shadow register, a fuse box addressing circuit to read a fuse value from a fuse of the fuse box, a clock circuit coupled to the address counter to provide a clock signal to the address counter, and a randomization circuit to interrupt the clock signal at random times to prevent the address counter from determining a next address in response to the clock signal.

Abstract: The invention relates to a random clock generator comprising an input receiving a master clock signal MCIk, and a clock signal reduction circuit (101) receiving the master clock signal MCIk and a whole number N and supplying an output signal corresponding to a train of N pulses every M clock pulse, M being a whole number higher than 1 and N being a whole number higher than 1 and lower than or equal to M. A number generator (102) and (103) supplies a new number (N) to the clock signal reduction circuit every P pulse of a master clock signal, N and/or P being produced randomly.

Abstract: The invention relates to a random clock generator comprising an input receiving a master clock signal MCIk, and a clock signal reduction circuit (101) receiving the master clock signal MCIk and a whole number N and supplying an output signal corresponding to a train of N pulses every M clock pulse, M being a whole number higher than 1 and N being a whole number higher than 1 and lower than or equal to M. A number generator (102) and (103) supplies a new number (N) to the clock signal reduction circuit every P pulse of a master clock signal, N and/or P being produced randomly.