Patents by Inventor Joris Eeckhout

Joris Eeckhout has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for high throughput testing of a treatment on one or more characteristic of plants
    Patent number: 10772275
    Abstract: The invention relates to a method and apparatus for evaluation of the effect of a treatment on one or more characteristics of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of the effect of a treatment on one or more characteristics of a plant.
    Type: Grant
    Filed: April 28, 2017
    Date of Patent: September 15, 2020
    Assignee: BASF PLANT SCIENCE COMPANY GMBH
    Inventors: Frederik Leyns, Joris Eeckhout
  • Method and apparatus for measuring inflorescence, seed and/or seed yield phenotype
    Patent number: 10712325
    Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
    Type: Grant
    Filed: July 18, 2019
    Date of Patent: July 14, 2020
    Assignee: BASF PLANT SCIENCE COMPANY GMBH
    Inventors: Pierre Lejeune, Jeroen Baert, Frederik Leyns, Joris Eeckhout
  • METHOD AND APPARATUS FOR MEASURING INFLORESCENCE, SEED AND/OR SEED YIELD PHENOTYPE
    Publication number: 20190346419
    Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
    Type: Application
    Filed: July 18, 2019
    Publication date: November 14, 2019
    Inventors: Pierre Lejeune, Jeroen Baert, Frederik Leyns, Joris Eeckhout
  • Method and apparatus for measuring inflorescence, seed and/or seed yield phenotype
    Patent number: 10393719
    Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
    Type: Grant
    Filed: December 6, 2016
    Date of Patent: August 27, 2019
    Assignee: BASF PLANT SCIENCE COMPANY GMBH
    Inventors: Pierre Lejeune, Jeroen Baert, Frederik Leyns, Joris Eeckhout
  • METHOD AND APPARATUS FOR HIGH THROUGHPUT TESTING OF A TREATMENT ON ONE OR MORE CHARACTERISTIC OF PLANTS
    Publication number: 20190116749
    Abstract: The invention relates to a method and apparatus for evaluation of the effect of a treatment on one or more characteristics of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of the effect of a treatment on one or more characteristics of a plant.
    Type: Application
    Filed: April 28, 2017
    Publication date: April 25, 2019
    Inventors: Frederik Leyns, Joris Eeckhout
  • Method and Apparatus for Measuring Inflorescence, Seed and/or Seed Yield Phenotype
    Publication number: 20180356385
    Abstract: The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield phenotype of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.
    Type: Application
    Filed: December 6, 2016
    Publication date: December 13, 2018
    Inventors: Pierre Lejeune, Jeroen Baert, Frederik Leyns, Joris Eeckhout