Abstract: A method of measuring solar cells, wherein a voltage (U) or a current (I) is applied to a solar cell, and a current (I) and voltage (U), respectively, resulting therefrom is measured, and wherein prior to applying the voltage (U) or current (I) and during or after measuring the resulting current (I) and resulting voltage (U), respectively, a relative distribution of radiation emitted across the solar cell surface area is measured, wherein the voltage (U) or current (I) is applied as at least one pulse with a predeterminable, constant value for a predeterminable period of time, wherein an energy value is calculated from the resulting current (I) and resulting voltage (U), respectively, wherein a first relative distribution of radiation emitted across the solar cell surface area is measured prior to the pulse or each pulse and a second relative distribution of radiation emitted across the solar cell surface area is measured during or after the pulse or each pulse, and wherein a difference distribution is genera

Abstract: A method of measuring solar cells, wherein a voltage (U) or a current (I) is applied to a solar cell, and a current (I) and voltage (U), respectively, resulting therefrom is measured, and wherein prior to applying the voltage (U) or current (I) and during or after measuring the resulting current (I) and resulting voltage (U), respectively, a relative distribution of radiation emitted across the solar cell surface area is measured, wherein the voltage (U) or current (I) is applied as at least one pulse with a predeterminable, constant value for a predeterminable period of time, wherein an energy value is calculated from the resulting current (I) and resulting voltage (U), respectively, wherein a first relative distribution of radiation emitted across the solar cell surface area is measured prior to the pulse or each pulse and a second relative distribution of radiation emitted across the solar cell surface area is measured during or after the pulse or each pulse, and wherein a difference distribution is genera

Abstract: The invention relates to a method and device for characterizing wafers during the production of solar cells. Characterizing wafers includes a) providing a wafer and carrying out a production process with the wafer for producing a solar cell or a plurality of solar cells; b) carrying out a wet chemical step with the wafer during the production process, wherein the wet chemical step decreases an influence of the wafer surface on a lifetime of charge carriers in the wafer; c) irradiating the wafer with light for creating the charge carriers in the wafer during the wet chemical step or after the wet chemical step; d) determining the lifetime of the charge carriers created in step c); and e) characterizing the wafer by means of the lifetime determined in step d).

Abstract: The invention relates to a method for characterizing wafers during the production of solar cells, comprising the steps: a) providing a wafer and carrying out a production process with the wafer for producing a solar cell or a plurality of solar cells; b) carrying out a wet chemical step with the wafer during the production process, wherein the wet chemical step decreases an influence of the wafer surface on the lifetime of charge carriers in the wafer; c) irradiating the wafer with light for creating charge carriers in the wafer during the wet chemical step or after the wet chemical step; d) determining the lifetime of the charge carriers created in step c); and e) characterizing the wafer by means of the lifetime determined in step d). In a second aspect, the invention relates to a device for characterizing wafers during the production of solar cells.