Patents by Inventor Jose Abdiel Rodriguez-Latorre

Jose Abdiel Rodriguez-Latorre has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Low cost apparatus for insitu testing of packaged integrated circuits during stressing
    Patent number: 10209297
    Abstract: An apparatus with a burn-in board containing a microcontroller unit and a heater socket for insitu testing of a packaged integrated circuit while under stress. A method for insitu testing of a packaged integrated circuit while under stress. A method for insitu testing of multiple packaged integrated circuits while under stress.
    Type: Grant
    Filed: January 11, 2016
    Date of Patent: February 19, 2019
    Assignee: Texas Instruments Incorporated
    Inventors: Ning Tan, Jose Abdiel Rodriguez-Latorre
  • Low Cost Apparatus for Insitu Testing of Packaged Integrated Circuits During Stressing
    Publication number: 20170199238
    Abstract: An apparatus with a burn-in board containing a microcontroller unit and a heater socket for insitu testing of a packaged integrated circuit while under stress. A method for insitu testing of a packaged integrated circuit while under stress. A method for insitu testing of multiple packaged integrated circuits while under stress.
    Type: Application
    Filed: January 11, 2016
    Publication date: July 13, 2017
    Inventors: Ning Tan, Jose Abdiel Rodriguez-Latorre