Abstract: Dietary supplements and formulations for a subject, including veterinary animals and humans, in an oral preparation and/or parenteral preparation, are provided. The formulations comprise elevated amounts of hydrolyzed collagen, a glucosamine salt, a glycosaminoglycan, a sulfone, a polysaccharide acid, an ascorbate salt, a transition metal, and a polyunsaturated fatty acid. A method for enhancing joint health and/or joint repair in a subject, including veterinary animals and humans, having a joint disorder or a disease associated therewith, is also provided, comprising administering the preparation comprising high amounts of hydrolyzed collagen.

Abstract: A structure and method of constructing a tip for a contact pin used in IC test housing for testing integrated circuits. As the pin is deflected when the device under test (DUT) pad engaged the tip of the pin, the tip pressure normally increases as the elastomers biasing the pin are engaged. This causes the elastomer supporting the tip to increase pressure. By widening the tip as it rolls, the pressure is maintained more constant. Also, as the top wears, the pressure on the DUT will be reduced. By making the contact area of the tip to DUT smaller as it wears, the pressure can be made more constant.

Abstract: An electrical contact device has a housing with a vertical cavity and a horizontal cavity. A first contact element with a base that fits into the bottom of the vertical cavity of the housing, having a vertical primary protrusion from the end of the base, and having another vertical secondary protrusion from the other end of the base. The end of the secondary protrusion has a tertiary horizontal protrusion. The second contact element fits into the vertical cavity of the housing. The end of second contact element has a nub that inserts into a matching indentation under the tertiary protrusion of the first contact element, and acts as a retention feature. The other end of the second element is a vertical primary protrusion making contact with a device. A compliant element is positioned within the horizontal cavity of the housing and bracketed by the first contact element.

Abstract: The electrical contact device has an insulative, compliant element with a first surface that is next to the load board and has a cavity from the first to the second surface. At the top of the compliant element is an insulative compliant sheet with a hole that aligns with the cavity. At the bottom of the compliant element is an insulative compliant plate with a hole that aligns with the cavity. A first contact element inserts into the compliant plate hole and forming the bottom of the cavity of the compliant element and having a primary protrusion with an oblique surface that faces both the wider cavity opening. A second contact element fits into the hole of the compliant sheet and having a primary protrusion with an oblique surface that mates onto and substantially parallel to the first contact element's oblique surface.

Abstract: An electrical contact device having a housing with a square or rectangular hole formed within first and second crossing channels that extends laterally from the hole. A conductive first contact element fits into the hole, while a second contact element fits onto the top opening of the first contact element. The primary and secondary contact elements have flange protrusions that overlap. In addition, the second contact element has a tail with an oblique surface facing the top of a compliant uniform rod and the proximate primary or secondary protrusion of the first contact element. A compliant rod is positioned between the first contact element's primary and secondary protrusions, such that when the first contact element is positioned over a fixed surface and the second contact element is pushed downward when an inward force is applied, the second contact element's external contact surface slides laterally.

Abstract: A structure and method of constructing a tip for a contact pin used in IC test housing for testing integrated circuits. As the pin is deflected when the device under test (DUT) pad engaged the tip of the pin, the tip pressure normally increases as the elastomers biasing the pin are engaged. This causes uneven pressure on the tip and will create debris and reduce tip life. By making the surface of the tip wider in the X or Y direction the surface pressure is reduced during the pin contact cycle. It is also possible to reduce tip pressure by having the top surface change in the Z axis so that recedes downwardly along its travel path, the pressure is reduced.

Abstract: An apparatus for generating power includes a cage having a plurality of elongated elements defining a space within the cage, wherein the space has a region for allowing ion collision to occur, and a pair of electromagnets located at or near respective opposite ends of the cage. An apparatus for generating power includes a vacuum chamber, a first solenoid, a second solenoid, wherein the first and the second solenoids are located on opposite sides of the vacuum chamber, and a coupler that mechanically couples the first solenoid to the second solenoid, wherein the coupler has an end defining an opening that resembles a dumbbell shape.

Abstract: An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

Abstract: A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.

Abstract: An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

Abstract: An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.