Patents by Inventor Jose Solomon

Jose Solomon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multi-tier network for task-oriented deep neural network
    Patent number: 10839230
    Abstract: A method for controlling an autonomous vehicle is disclosed. The method may include receiving image data. The image data may be logistically classified by a first neural network as pertaining to one situation of a plurality of situations. Based on this logistic classification, the image data may be assigned to a second neural network that is specifically trained to address the one situation. The second neural network may perform regression on the image data. Thereafter, the vehicle may be control with a command based on the regression.
    Type: Grant
    Filed: September 6, 2018
    Date of Patent: November 17, 2020
    Assignee: FORD GLOBAL TECHNOLOGIES, LLC
    Inventors: Francois Charette, Jose Solomon
  • Multi-Tier Network for Task-Oriented Deep Neural Network
    Publication number: 20200082174
    Abstract: A method for controlling an autonomous vehicle is disclosed. The method may include receiving image data. The image data may be logistically classified by a first neural network as pertaining to one situation of a plurality of situations. Based on this logistic classification, the image data may be assigned to a second neural network that is specifically trained to address the one situation. The second neural network may perform regression on the image data. Thereafter, the vehicle may be control with a command based on the regression.
    Type: Application
    Filed: September 6, 2018
    Publication date: March 12, 2020
    Inventors: Francois Charette, Jose Solomon
  • Method and system for determining in-plane distortions in a substrate
    Patent number: 10024654
    Abstract: The determination of in-plane distortions of a substrate includes measuring one or more out-of-plane distortions of the substrate in an unchucked state, determining an effective film stress of a film on the substrate in the unchucked state based on the measured out-of-plane distortions of the substrate in the unchucked state, determining in-plane distortions of the substrate in a chucked state based on the effective film stress of the film on the substrate in the unchucked state and adjusting at least one of a process tool or an overlay tool based on at least one of the measured out-of-plane distortions or the determined in-plane distortions.
    Type: Grant
    Filed: April 5, 2016
    Date of Patent: July 17, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Mark D. Smith, Jose Solomon, Stuart Sherwin, Walter Mieher, Ady Levy
  • Method and System for Determining In-Plane Distortions in a Substrate
    Publication number: 20160290789
    Abstract: The determination of in-plane distortions of a substrate includes measuring one or more out-of-plane distortions of the substrate in an unchucked state, determining an effective film stress of a film on the substrate in the unchucked state based on the measured out-of-plane distortions of the substrate in the unchucked state, determining in-plane distortions of the substrate in a chucked state based on the effective film stress of the film on the substrate in the unchucked state and adjusting at least one of a process tool or an overlay tool based on at least one of the measured out-of-plane distortions or the determined in-plane distortions.
    Type: Application
    Filed: April 5, 2016
    Publication date: October 6, 2016
    Inventors: Mark D. Smith, Jose Solomon, Stuart Sherwin, Walter Mieher, Ady Levy