Abstract: An X-ray beam generating system including an X-ray source for generating an original primary X-ray beam, an optics system including a first optics component and at least one second optics component which are movable relative to the X-ray source in order either to bring the first optics component into interaction with the original primary X-ray beam, whereupon a first primary X-ray beam is generated which is deflected at a first deflection angle, or to bring the second optics component into interaction with the original primary X-ray beam, whereupon a second primary X-ray beam is generated which is deflected at a second deflection angle, and a rotating device to rotate the X-ray beam generating system through either a first rotation angle or a second rotation angle to allow either the first primary X-ray beam or the second primary X-ray beam to impinge on a sample region.

Abstract: A device for examining a sample by X-radiation having a radiation generation system for generating primary radiation, a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis, a detection system configured to detect secondary radiation emanating from the sample, a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis, and an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence.

Abstract: An X-ray beam generating system including an X-ray source for generating an original primary X-ray beam, an optics system including a first optics component and at least one second optics component which are movable relative to the X-ray source in order either to bring the first optics component into interaction with the original primary X-ray beam, whereupon a first primary X-ray beam is generated which is deflected at a first deflection angle, or to bring the second optics component into interaction with the original primary X-ray beam, whereupon a second primary X-ray beam is generated which is deflected at a second deflection angle, and a rotating device to rotate the X-ray beam generating system through either a first rotation angle or a second rotation angle to allow either the first primary X-ray beam or the second primary X-ray beam to impinge on a sample region.

Abstract: A device for examining a sample by means of X-radiation is provided, the device comprising: a radiation generation system for generating primary radiation; a first goniometer arm on which the radiation generation system is mounted and which is pivotable about a goniometer axis; a detection system configured to detect secondary radiation emanating from the sample; a second goniometer arm on which the detection system is mounted and which is pivotable about the goniometer axis; an evacuable sample chamber within which the sample is arrangeable in a sample region encompassing a portion of the goniometer axis, the sample chamber being delimited by a sample chamber wall which has a transmission region which is transmissive to the primary radiation and is vacuum-tight, in order to allow the primary radiation to penetrate into the sample chamber and to impinge on the sample region at different angles of incidence; wherein the sample chamber has a first opening in a detection beam path, at which the sample chamber an

Abstract: A method and a device examine a sample with radiation emitted from a radiation source, which is directed to the sample carried by a sample holder via a beamforming unit and detected by a detector and evaluated in an evaluating unit. Prior to the examination of the sample, at least one of the following components, including the radiation source, beamforming unit, sample holder, detector, and a primary beam stop, are spatially oriented and/or positioned in relation to at least one of the other components and/or in relation to a predefined fixed point and/or in relation to the optical path with a control unit via actuating drives. The radiation intensity measured by the detector, in a predefined detector range, and/or a value derived therefrom is used for establishing a control variable conferred from the control unit to the actuating drives assigned to the components.

Abstract: A sample temperature control chamber is described for a benchtop X-ray machine and/or full-protection X-ray machine, which comprises (a) a first chamber part (11) and a second chamber part (12) which can be connected together and are configured so as to form a closed chamber, (b) a sample holder, (c) an integrated temperature control device for controlling the temperature of a sample (P) which is provided on the sample holder, and (d) an active cooling system for dissipating heat from the sample temperature control chamber, the active cooling system comprising a heat sink and/or a fan. A system for X-ray-based analysis of a sample, in particular for X-ray diffraction measurements, is also described.

Abstract: A rotary rheometer has a stator arranged in a rotationally invariant fashion, and a rotor that can be rotated about the axis of the stator by an eddy current drive. Wherein the test medium to be examined can be introduced into at least one measuring gap formed between surfaces of the rotor and the stator located opposite of one another. Accordingly, the measuring gap filled with the test medium to be examined functions as and/or is configured as a hydrodynamic bearing between the rotor and the stator. The distance and mutual position of the mutually facing surfaces of the rotor and the stator defining the measuring gap are predetermined and set, and are maintained during the measuring process, exclusively by the hydrodynamic bearing action generated by the rotation of the rotor relative to the stator.

Abstract: A sample temperature control chamber is described for a benchtop X-ray machine and/or full-protection X-ray machine, which comprises (a) a first chamber part (11) and a second chamber part (12) which can be connected together and are configured so as to form a closed chamber, (b) a sample holder, (c) an integrated temperature control device for controlling the temperature of a sample (P) which is provided on the sample holder, and (d) an active cooling system for dissipating heat from the sample temperature control chamber, the active cooling system comprising a heat sink and/or a fan. A system for X-ray-based analysis of a sample, in particular for X-ray diffraction measurements, is also described.

Abstract: A method and a device examine a sample with radiation emitted from a radiation source, which is directed to the sample carried by a sample holder via a beam-forming unit and detected by a detector and evaluated in an evaluating unit. Prior to the examination of the sample, at least one of the following components, including the radiation source, beam-forming unit, sample holder, detector, and a primary beam stop, are oriented and/or positioned in terms of spatial location in relation to at least one of the other components and/or in relation to a predefined fixed point and/or in relation to the optical path with a control unit via actuating drives. The radiation intensity measured by the detector, in a predefined detector range, and/or a value derived therefrom is used for establishing a control variable conferred from the control unit to the actuating drives assigned to the components.

Abstract: In a method for determining the viscosity of fluids, especially liquids, the fluid is brought into and moved through a tapering gap bounded by two opposite wall surfaces. Accordingly, a distance or the change of the distance between the opposite wall surfaces is measured by pressure exerted by the material moved through the preferably steadily tapering or narrowing gap onto the walls and is used or evaluated as a measurement value for the viscosity of the fluid.

Abstract: A method for determining the content quantities, solubilities and/or saturation pressures of gases dissolved in a liquid, which is characterized in that in order selectively to determine the individual content quantities of at least two gases dissolved in a liquid sample, more particularly carbon dioxide, nitrogen and/or oxygen, and/or the solubilities or saturation pressures thereof, the volume of at least one measuring chamber filled with the liquid for testing is increased the volume of at least two steps by volume increase factors differing one from another, each having numerical values greater than 1, in that, after each of the volume increase steps, the equilibrium pressure established in the measuring chamber is ascertained, and in that, on the basis of the at least two measured pressure values obtained in this way, the content quantities of the individual gases dissolved in the liquid, and/or the solubility or saturation pressure thereof, are calculated individually.

Abstract: The invention relates to a new method for determining the content quantities, solubilities and/or saturated vapor pressures of gases dissolved in a liquid, which is characterized in that in order selectively to determine the individual content quantities of at least two gases dissolved in the sample liquid, more particularly carbon dioxide, nitrogen and/or oxygen, and/or the solubilities or saturated vapor pressures thereof, the volume of at least one measuring chamber filled with the liquid for testing is increased in at least two steps by volume increase factors differing one from another—each having numerical values greater than 1—, in that, after each of the volume increase steps, the equilibrium pressure establishing in the measuring chamber is ascertained, and in that, on the basis of the at least two measured pressure values obtained in this way, the content quantities of the individual gases dissolved in the liquid, and/or the solubility or saturated vapor pressure thereof are calculated i