Patents by Inventor Josef K. Roper

Josef K. Roper has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Marking method for the reject marking of test elements
    Patent number: 10535442
    Abstract: The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.
    Type: Grant
    Filed: December 12, 2013
    Date of Patent: January 14, 2020
    Assignee: ROCHE DIABETES CARE, INC.
    Inventors: Josef K. Roper, Werner Finke, Martin Frank, Gunter Schmidt, Siegfried Dick, Peter Stubenbord
  • MARKING METHOD FOR THE REJECT MARKING OF TEST ELEMENTS
    Publication number: 20140096368
    Abstract: The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.
    Type: Application
    Filed: December 12, 2013
    Publication date: April 10, 2014
    Applicant: Roche Diagnostics Operations, Inc.
    Inventors: Josef K. Roper, Werner Finke, Martin Frank, Gunter Schmidt, Siegfried Dick, Peter Stubenbord
  • Marking method for the reject marking of test elements
    Patent number: 8618511
    Abstract: The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.
    Type: Grant
    Filed: September 18, 2008
    Date of Patent: December 31, 2013
    Assignee: Roche Diagnostics Operations, Inc.
    Inventors: Josef K. Röper, Werner Finke, Martin Frank, Günter Schmidt, Siegfried Dick, Peter Stubenbord
  • MARKING METHOD FOR THE REJECT MARKING OF TEST ELEMENTS
    Publication number: 20090090874
    Abstract: The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.
    Type: Application
    Filed: September 18, 2008
    Publication date: April 9, 2009
    Inventors: Josef K. Roper, Werner Finke, Martin Frank, Gunter Schmidt, Siegfried Dick, Peter Stubenbord