Patents by Inventor Josef Kreith

Josef Kreith has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray analysis apparatus with single crystal X-ray aperture and method for manufacturing a single crystal X-ray aperture
    Patent number: 9279776
    Abstract: An X-ray analysis apparatus has at least one X-ray aperture (4; 4a, 4b) which delimits an X-ray beam (RS) emitted by an X-ray source (2). The at least one X-ray aperture (4; 4a, 4b) is disposed at a separation from the sample (5) and has a single crystal aperture body (8) with a through pinhole (9). The single crystal aperture body (8) forms a peripheral continuous edge (10) which delimits the X-ray beam (RS) and starting from which the pinhole (9) widens like a funnel in a direction of an outlet opening (11) of the X-ray aperture (4; 4a, 4b) in a first area (B1). The X-ray analysis apparatus reduces impairment of X-ray measurements due to parasitic scattered radiation and at little expense.
    Type: Grant
    Filed: May 16, 2013
    Date of Patent: March 8, 2016
    Assignee: incoatec GmbH
    Inventors: Andreas Kleine, Josef Kreith, Frank Hertlein
  • X-ray analysis apparatus with single crystal X-ray aperture and method for manufacturing a single crystal X-ray aperture
    Publication number: 20130315375
    Abstract: An X-ray analysis apparatus has at least one X-ray aperture (4; 4a, 4b) which delimits an X-ray beam (RS) emitted by an X-ray source (2). The at least one X-ray aperture (4; 4a, 4b) is disposed at a separation from the sample (5) and has a single crystal aperture body (8) with a through pinhole (9). The single crystal aperture body (8) forms a peripheral continuous edge (10) which delimits the X-ray beam (RS) and starting from which the pinhole (9) widens like a funnel in a direction of an outlet opening (11) of the X-ray aperture (4; 4a, 4b) in a first area (B1). The X-ray analysis apparatus reduces impairment of X-ray measurements due to parasitic scattered radiation and at little expense.
    Type: Application
    Filed: May 16, 2013
    Publication date: November 28, 2013
    Inventors: Andreas Kleine, Josef Kreith, Frank Hertlein