Patents by Inventor Josef-Maria Kosanetzky

Josef-Maria Kosanetzky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4995066
    Abstract: A device for forming an X-ray beam or gamma beam (11) having a small cross-section and a variable direction, includes an X-ray source or gamma source (1) which supplies an X-ray beam and a diaphragm device which forms the X-ray beam from the radiation beam. The diaphragm device has a stationary diaphragm section (7) provided with a rectilinear slit (8) and a cylindrical first diaphragm body (3) which rotates about an axis of rotation (5) and which is provided with a helical slit (9) on its outer surface. In order to reduce the expenditure for manufacturing a device which is also suitable for different distances between the radiation source and the axis of rotation, the diaphragm body (3) has an at least approximately semi-circular cross-section over at least a part of its length.
    Type: Grant
    Filed: August 29, 1989
    Date of Patent: February 19, 1991
    Assignee: U. S. Philips Corporation
    Inventors: Geoffrey Harding, Josef-Maria Kosanetzky, Karl-Heinz Fischer, Alfred G. Meyer
  • Patent number: 4887285
    Abstract: The invention relates to a method of determining the share of different chemical elements in a layer of an examination zone. The Compton scattered radiation and the Rayleigh scattered radiation are separately determined and the variation of the differential scatter coefficients derived from the measurement values is influenced by the shares of the various chemical elements contained in the individual pixels. Therefore, the share of these chemical elements can be determined therefrom.
    Type: Grant
    Filed: March 11, 1987
    Date of Patent: December 12, 1989
    Assignee: U.S. Philips Corporation
    Inventors: Geoffrey Harding, Josef-Maria Kosanetzky
  • Patent number: 4850002
    Abstract: The invention relates to a method of determining the Compton profile of an object to be examined which is situated in an examination zone. The examination zone is irradiated by a monochromatic primary beam whose energy is chosen so that the attenuation of the primary radiation is due essentially only to the Compton Scattering. The scattered radiation is measured in an energy resolving manner and therefrom, as well as from the attenuation in the primary beam, the Compton profiles for the individual pixels in the examination zone are determined.
    Type: Grant
    Filed: September 3, 1987
    Date of Patent: July 18, 1989
    Assignee: U.S. Philips Corporation
    Inventors: Geoffrey Harding, Josef-Maria Kosanetzky, Ulrich Neitzel
  • Patent number: 4785401
    Abstract: A method and apparatus for measurement of an energy-independent attenuation factor in a predetermined area of a primary X-ray beam which passes through a test object. Two detectors measure scattered radiation on closely adjacent paths in each of two different spectral ranges. The attenuation factor is calculated from the difference of the logarithms of quotients of measurements taken at different engergies.
    Type: Grant
    Filed: September 22, 1986
    Date of Patent: November 15, 1988
    Assignee: U.S. Philips Corporation
    Inventors: Geoffrey Harding, Josef-Maria Kosanetzky
  • Patent number: 4754469
    Abstract: The invention relates to a method for determination of the cross-sections for elastic scattered radiation in which a polychromatic radiation source is used but in which good differentiation between various substances is still possible.
    Type: Grant
    Filed: July 11, 1986
    Date of Patent: June 28, 1988
    Assignee: U.S. Philips Corp.
    Inventors: Geoffrey Harding, Josef-Maria Kosanetzky, Ulrich Neitzel