Abstract: A method of optically measuring a surface of a measurement object is disclosed. The method includes generating image light having an image pattern, projecting the generated image light onto the measurement object, and recording influenced light having an influenced image pattern. The image light is generated by an image generation device and the influenced light is captured by a capturing device. The influenced light is light that is reflected, scattered, diffracted, and/or transmitted by the measurement object based on interaction of the image light with the measurement object. The method further includes applying a correcting function to the image light. The correction function alters the image light such that the influenced image pattern recorded by the capturing device shows temporally and/or locally an at least approximately constant and/or homogenous and/or linear brightness. A device having an image generation device, image capture device, and correcting device is also disclosed.

Abstract: A method of optically measuring a surface of a measurement object is disclosed. The method includes generating image light having an image pattern, projecting the generated image light onto the measurement object, and recording influenced light having an influenced image pattern. The image light is generated by an image generation device and the influenced light is captured by a capturing device. The influenced light is light that is reflected, scattered, diffracted, and/or transmitted by the measurement object based on interaction of the image light with the measurement object. The method further includes applying a correcting function to the image light. The correction function alters the image light such that the influenced image pattern recorded by the capturing device shows temporally and/or locally an at least approximately constant and/or homogenous and/or linear brightness. A device having an image generation device, image capture device, and correcting device is also disclosed.

Abstract: A method of optically measuring a surface of a measurement object is disclosed. The method includes generating image light having an image pattern, projecting the generated image light onto the measurement object, and recording influenced light having an influenced image pattern. The image light is generated by an image generation device and the influenced light is captured by a capturing device. The influenced light is light that is reflected, scattered, diffracted, and/or transmitted by the measurement object based on interaction of the image light with the measurement object. The method further includes applying a correcting function to the image light. The correction function alters the image light such that the influenced image pattern recorded by the capturing device shows temporally and/or locally an at least approximately constant and/or homogenous and/or linear brightness. A device having an image generation device, image capture device, and correcting device is also disclosed.

Abstract: The invention relates to a method for computer-aided segmentation of an environment into individual objects, in particular of a wood into individual trees, in which signals (SIG_R) backscattered by the objects are recorded by measurement technology, wherein the backscattered signals (SIG_R) result from the irradiation of the environment to be segmented with electromagnetic radiation. Furthermore, in the method according to the invention, spatial co-ordinates (x, y, z) of points which cause the backscattering and represent the object parts (X1, X2, . . . , X5) are determined from the backscattered signals (SIG_R), and a feature vector (f) is assigned to each of the points (P; P1, P2), which feature vector comprises at least the spatial co-ordinates (x, y, z) of the point in question (P; P1, P2). Then a distance measure (d) is determined for each of the feature vectors (f), which represents a similarity between the feature vectors (f) of two points (P; P1, P2).

Abstract: The invention relates to a method for computer-aided segmentation of an environment into individual objects, in particular of a wood into individual trees, in which signals (SIG_R) backscattered by the objects are recorded by measurement technology, wherein the backscattered signals (SIG_R) result from the irradiation of the environment to be segmented with electromagnetic radiation. Furthermore, in the method according to the invention, spatial co-ordinates (x, y, z) of points which cause the backscattering and represent the object parts (X1, X2, . . . , Xs) are determined from the backscattered signals (SIG_R), and a feature vector (f) is assigned to each of the points (P; P1, P2), which feature vector comprises at least the spatial co-ordinates (x, y, z) of the point in question (P; P1, P2). Then a distance measure (d) is determined for each of the feature vectors (f), which represents a similarity between the feature vectors (f) of two points (P; P1, P2).