Patents by Inventor Josef Sesták

Josef Sesták has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9741527
    Abstract: A specimen holder for a Charged Particle Microscope is disclosed. The holder has a support structure with an elongated member including a specimen mounting zone. The specimen mounting zone comprises a rotor with an axis perpendicular to the elongated member with a paddle connected to it which may be rotated. Specimens may be mounted on the paddle so that rotation of the paddle allows specimens to be rotated and/or inverted for microscopic observation on both sides. Specimens may either be directly mounted on the paddle, or on a grid, half-moon grid, lift-out grid, aperture frame, dielectric film, etc.
    Type: Grant
    Filed: December 21, 2015
    Date of Patent: August 22, 2017
    Assignee: FEI Company
    Inventors: Tomas Vystavel, Josef Sestak, Pavel Poloucek, Lubomir Tuma, Michal Hrouzek, Tomas Trnkocy, Martin Cafourek
  • Publication number: 20160181059
    Abstract: A specimen holder for a Charged Particle Microscope, comprising: A support structure; An elongated member, a first end of which is connected to said support structure and the second end of which comprises a specimen mounting zone, the member having a longitudinal axis that extends along its length between said first and second ends, wherein said specimen mounting zone comprises: A rotor that is rotatable about a transverse axis extending substantially perpendicular to said longitudinal axis; A paddle connected to said rotor so as to be rotatable about said transverse axis, the paddle comprising a specimen mounting area; Driving means connected to said rotor, which can be invoked to rotate said paddle through a rotational range that allows the paddle to be inverted relative to an initial orientation thereof.
    Type: Application
    Filed: December 21, 2015
    Publication date: June 23, 2016
    Applicant: FEI Company
    Inventors: Tomas Vystavel, Josef Sestak, Pavel Poloucek, Lubomir Tuma, Michal Hrouzek, Tomas Trnkocy, Martin Cafourek
  • Publication number: 20140110597
    Abstract: The invention relates to a charged-particle apparatus having a charged particle source with an optical axis; a magnetic immersion lens comprising a first lens pole and a configurable magnetic circuit; and a first sample stage movable with respect to the optical axis. The apparatus has a first configuration to position the sample, mounted on the first stage, with respect to the optical axis and a second configuration, having a second lens pole mounted on the first stage and intersecting the optical axis, equipped with a second sample stage to position the sample between the two lens poles and is movable with respect to the optical axis, causing the optical properties of the magnetic immersion lens to differ in the two configurations, and can, in the second configuration, be changed by positioning the second lens pole using the first stage, thus changing the magnetic circuit.
    Type: Application
    Filed: October 22, 2013
    Publication date: April 24, 2014
    Applicant: FEI Company
    Inventors: Lubomir Tuma, Josef Sesták