Patents by Inventor Josefina Nilsson

Josefina Nilsson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for Making Polyoxyethylene 1,4 Sorbitan Fatty Acid Ester
    Publication number: 20210324139
    Abstract: The invention discloses a method for preparation of polyoxyethylene 1,4-sorbitan fatty acid ester, such as Polysorbate 80, by a reaction of polyoxyethylene 1,4-sorbitan with a fatty acid chloride, and polyoxyethylene 1,4-sorbitan fatty acid esters obtainable by this method.
    Type: Application
    Filed: September 4, 2019
    Publication date: October 21, 2021
    Inventors: Dieter Scherer, Benjamin Wyler, Jieping Wei, Yanling Yang, Daniel Shan, Reta Zhu, Paul Hanselmann, Tania Kjellerup Lind, Emelie Josefina Nilsson, Vitaly Kocherbitov, Johan Engblom
  • Method for quantification of purity of sub-visible particle samples
    Patent number: 11002689
    Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.
    Type: Grant
    Filed: August 23, 2019
    Date of Patent: May 11, 2021
    Assignee: INTELLIGENT VIRUS IMAGING INC.
    Inventors: Ida-Maria Sintorn, Martin Ryner, Gustaf Kylberg, Josefina Nilsson
  • METHOD FOR QUANTIFICATION OF PURITY OF SUB-VISIBLE PARTICLE SAMPLES
    Publication number: 20190376910
    Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.
    Type: Application
    Filed: August 23, 2019
    Publication date: December 12, 2019
    Inventors: Ida-Maria Sintorn, Martin Ryner, Gustaf Kylberg, Josefina Nilsson
  • Method for quantification of purity of sub-visible particle samples
    Patent number: 10451566
    Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.
    Type: Grant
    Filed: September 11, 2017
    Date of Patent: October 22, 2019
    Assignee: Intelligent Virus Imaging Inc.
    Inventors: Ida-Maria Sintorn, Martin Ryner, Gustaf Kylberg, Josefina Nilsson
  • METHOD FOR QUANTIFICATION OF PURITY OF SUB-VISIBLE PARTICLE SAMPLES
    Publication number: 20190011378
    Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.
    Type: Application
    Filed: September 11, 2017
    Publication date: January 10, 2019
    Applicant: Intelligent Virus Imaging Inc.
    Inventors: Ida-Maria Sintorn, Martin Ryner, Gustaf Kylberg, Josefina Nilsson