Patents by Inventor Joseph A. Mirowski

Joseph A. Mirowski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inverted alignment station and method for calibrating needles of probe card for probe testing of integrated circuits
    Patent number: 6002426
    Abstract: A probe needle alignment device supports a probe card assembly with probe needles extending upward. A microscope includes a first eyepiece aligned with the probe needles in its field of view. A first video camera is positioned in optical alignment with the first eyepiece to view probe needles through the first eyepiece. An overdriver includes a transparent planar plate movably disposed between the microscope and the probe needles to displace contact tips of the probe needles through an overdrive distance. A mask plate has a plurality of spots located at positions corresponding precisely to positions of contact pads of an integrated circuit to be probe tested. A second video camera includes the spots within its field of view.
    Type: Grant
    Filed: July 2, 1997
    Date of Patent: December 14, 1999
    Assignee: Cerprobe Corporation
    Inventors: Gerald W. Back, Joseph A. Mirowski