Abstract: An example system includes a conductive sampling swab and a thermal desorber comprising an induction coil. The thermal desorber defines an opening configured to receive at least a portion of the conductive sampling swab within an internal volume defined by the induction coil, and the thermal desorber is configured to inductively heat the sampling swab to a temperature sufficient to vaporize a sample material disposed on the sampling swab.

Abstract: An example ion mobility spectrometry system includes a drift chamber, an ion detector, a thermal sensor, and processing circuitry. The drift chamber is configured to receive an ionized sample and an ionized calibrant. The ion detector is configured to generate a drift signal in response to detecting drifted ions at a predetermined position along the drift chamber. The thermal sensor is configured to generate a temperature signal indicative of a temperature of the drift chamber. The processing circuitry is configured to determine, based on the temperature signal, a mobility relation for a target species; determine, based on the drift signal, calibrant and sample drift times; determine, based on the mobility relation and the calibrant drift time, a target drift time; and detect the target species in the ionized sample by comparing the sample drift time with the target drift time.

Abstract: A system includes a conductive sampling swab including a non-mesh substrate and a thermal desorber including a clamping assembly configured to releasably hold the conductive sampling swab. The clamping assembly is configured to be electrically connected to a voltage or current source, and the thermal desorber is configured to resistively heat the conductive sampling swab to a temperature sufficient to vaporize a sample material disposed on the conductive sampling swab.

Abstract: A system includes a conductive sampling swab including a non-mesh substrate and a thermal desorber including a clamping assembly configured to releasably hold the conductive sampling swab. The clamping assembly is configured to be electrically connected to a voltage or current source, and the thermal desorber is configured to resistively heat the conductive sampling swab to a temperature sufficient to vaporize a sample material disposed on the conductive sampling swab.