Patents by Inventor Joseph Alan Turner

Joseph Alan Turner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and methods to determine and monitor changes in microstructural properties
    Patent number: 7942058
    Abstract: A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
    Type: Grant
    Filed: March 28, 2008
    Date of Patent: May 17, 2011
    Assignee: Board of Regents of the Universtiy of Nebraska
    Inventor: Joseph Alan Turner
  • SYSTEM AND METHODS TO DETERMINE AND MONITOR CHANGES IN MICROSTRUCTURAL PROPERTIES
    Publication number: 20110098942
    Abstract: A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. An example system includes a number of ultrasonic transducers configured to transmit ultrasonic waves towards a target region on a specimen, a voltage source configured to excite the first and second ultrasonic transducers, and a processor configured to determine one or more properties of the specimen.
    Type: Application
    Filed: January 4, 2011
    Publication date: April 28, 2011
    Applicant: Board of Regents of the University of Nebraska
    Inventor: Joseph Alan Turner
  • System and methods to determine and monitor changes in microstructural properties
    Publication number: 20090056454
    Abstract: The present invention is directed to a system and methods with changes in microstructure properties such as grain size, grain elongation, texture, and porosity, of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
    Type: Application
    Filed: March 28, 2008
    Publication date: March 5, 2009
    Inventor: Joseph Alan Turner