Patents by Inventor Joseph Bendahan

Joseph Bendahan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200025955
    Abstract: The present specification discloses methods for inspecting an object. The method includes scanning an object in a two-step process. In the primary scan, a truck or cargo container (container) is completely scanned with a fan beam radiation, the transmitted radiation is measured with an array of detectors, and the transmission information and optionally the fission signatures are analyzed to determine the presence of high-density, high-Z and fissionable materials. If the container alarms in one or more areas, the areas are subjected to a secondary scan. This is done by precisely repositioning the container to the location of the suspect areas, adjusting the scanning system to focus on the suspect areas, performing a stationary irradiation of the areas, and analyzing the measured feature signatures to clear or confirm the presence of SNM.
    Type: Application
    Filed: December 14, 2018
    Publication date: January 23, 2020
    Inventors: Tsahi Gozani, Joseph Bendahan, Michael Joseph King, Timothy John Shaw, John David Stevenson
  • Patent number: 10509142
    Abstract: The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: December 17, 2019
    Assignee: Rapiscan Systems, Inc.
    Inventors: Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan
  • Patent number: 10422919
    Abstract: The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.
    Type: Grant
    Filed: March 10, 2017
    Date of Patent: September 24, 2019
    Assignee: RAPISCAN SYSTEMS, INC.
    Inventors: Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan
  • Patent number: 10393915
    Abstract: The present specification discloses methods for inspecting an object. The method includes scanning an object in a two-step process. In the primary scan, a truck or cargo container (container) is completely scanned with a fan beam radiation, the transmitted radiation is measured with an array of detectors, and the transmission information and optionally the fission signatures are analyzed to determine the presence of high-density, high-Z and fissionable materials. If the container alarms in one or more areas, the areas are subjected to a secondary scan. This is done by precisely repositioning the container to the location of the suspect areas, adjusting the scanning system to focus on the suspect areas, performing a stationary irradiation of the areas, and analyzing the measured feature signatures to clear or confirm the presence of SNM.
    Type: Grant
    Filed: May 9, 2014
    Date of Patent: August 27, 2019
    Assignee: Rapiscan Systems, Inc.
    Inventors: Tsahi Gozani, Joseph Bendahan, Michael Joseph King, Timothy John Shaw, John David Stevenson
  • Patent number: 10386504
    Abstract: The present specification provides an X-ray inspection system including an X-ray source and a corresponding detector for detecting transmitted X rays having a wide range of intensities. The detector includes at least one crystal for producing a light signal upon interaction with X-rays. Each crystal is connected to at least one photodiode and a photomultiplier. A processing unit connected with the crystal rejects all detected radiation having energies below a predefined threshold value.
    Type: Grant
    Filed: October 20, 2016
    Date of Patent: August 20, 2019
    Assignee: Rapiscan Systems, Inc.
    Inventors: Joseph Bendahan, Jayesh Ranchhodbhai Patel
  • Publication number: 20190162873
    Abstract: The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.
    Type: Application
    Filed: January 15, 2019
    Publication date: May 30, 2019
    Inventors: Shehul Sailesh Parikh, Balamurugan Sankaranarayanan, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan
  • Publication number: 20190137651
    Abstract: An X-ray inspection system for scanning objects is provided. The system includes a stationary X-ray source made of one or more linear modules positioned around a scanning volume, and defining sparsely positioned multiple stationary X-ray source points from which X-rays can be directed through the scanning volume. An X-ray detector array extends around the scanning volume and is arranged to detect X-rays from the source points which have passed through the scanning volume. A conveyor is arranged to convey the objects through the scanning volume and at least one processor processes the detected X-rays to produce three dimensional images of the items.
    Type: Application
    Filed: September 5, 2018
    Publication date: May 9, 2019
    Inventor: Joseph Bendahan
  • Publication number: 20190043686
    Abstract: The present specification discloses a high power continuous X-ray source having a rotating target assembly that is cooled by circulation of a liquid material in contact with the target assembly, whereby the target assembly has a front surface being impinged by electrons and a mechanism for rotating the target assembly. The cooling liquid is always in contact with at least one surface of the target for dissipating the heat generated by the energy deposited by the stream of electrons, thereby lowering the temperature of the target to allow for continuous operation.
    Type: Application
    Filed: January 31, 2018
    Publication date: February 7, 2019
    Inventors: Joseph Bendahan, Robert Thomas Wiggers
  • Publication number: 20180017702
    Abstract: Systems and methods are used to increase the penetration and reduce the exclusion zone of radiographic systems. An X-ray detection method irradiates an object with X-ray fanlets including vertically moving fan beams, each fanlet having an angular range smaller than the angular coverage of the object. The fanlets are produced by modulating an X-ray beam, synchronizing the X-ray beam and the fanlets, detecting the fanlets irradiating the object, collecting image slices from the detector array corresponding to a complete scan cycle of the fanlets, and processing the image slices collected for combining into a composite image.
    Type: Application
    Filed: July 13, 2017
    Publication date: January 18, 2018
    Inventors: Joseph Bendahan, James Ollier
  • Publication number: 20170299526
    Abstract: The present specification discloses a covert mobile inspection vehicle with a backscatter X-ray scanning system that has an X-ray source and detectors for obtaining a radiographic image of an object outside the vehicle. The system is configured to also simultaneously detect passive radiation. The systems preferably include at least one sensor for determining a distance from at least one of the detectors to points on the surface of the object being scanned, a processor for processing the obtained radiographic image by using the determined distance of the object to obtain an atomic number of each material contained in the object, and one or more sensors to obtain surveillance data from a predefined area surrounding the vehicle.
    Type: Application
    Filed: December 22, 2016
    Publication date: October 19, 2017
    Inventors: Edward James Morton, Joseph Bendahan
  • Publication number: 20170299765
    Abstract: The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.
    Type: Application
    Filed: March 10, 2017
    Publication date: October 19, 2017
    Inventors: Shehul Sailesh Parikh, Balamurugan Sankaranarayaran, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan
  • Patent number: 9772426
    Abstract: The present invention is directed to an inspection system that has a radiation source, a detector array, an inspection region, and a processing unit, where the processing unit a) obtains a radiographic image, b) segments the radiographic image based on radiation attenuation or transmission, c) identifies at least one segmented area on the radiographic image, d) filters the at least one segmented area using at least one geometric filter, e) generates feature vectors using the filtered segmented area; and f) compares the feature vectors against predefined values to determine whether a high-atomic-number object is present.
    Type: Grant
    Filed: December 12, 2013
    Date of Patent: September 26, 2017
    Assignee: Rapiscan Systems, Inc.
    Inventors: Robert A. Armistead, Jr., William Chang, Edward D. Franco, Joseph Bendahan, Jolyon A. Browne
  • Publication number: 20170123077
    Abstract: The present specification provides an X-ray inspection system including an X-ray source and a corresponding detector for detecting transmitted X rays having a wide range of intensities. The detector includes at least one crystal for producing a light signal upon interaction with X-rays. Each crystal is connected to at least one photodiode and a photomultiplier. A processing unit connected with the crystal rejects all detected radiation having energies below a predefined threshold value.
    Type: Application
    Filed: October 20, 2016
    Publication date: May 4, 2017
    Inventors: Joseph Bendahan, Jayesh Ranchhodbhai Patel
  • Patent number: 9632206
    Abstract: The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.
    Type: Grant
    Filed: June 15, 2015
    Date of Patent: April 25, 2017
    Assignee: Rapiscan Systems, Inc.
    Inventors: Shehul Sailesh Parikh, Balamurugan Sankaranarayaran, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan
  • Patent number: 9625606
    Abstract: A second stage screening system configured to resolve a threat alarm detected in a cargo by a first stage screening system. The second stage screening system includes layers of first muon detectors placed above the cargo to detect a first coordinate and an angle of incidence of incoming muons and layers of second muon detectors placed below the cargo to detect an actual coordinate and an actual angle of exit of the incoming muons. The first and second detectors measure a momentum of the incoming muons. A processing unit receives threat sensitivity vectors determined from the first stage, operates a cargo positioning system that centers a high-Z threat within the cargo, relative to the first and second muon detectors, and analyzes the momentum and a distribution of deflection angles between the angles of incidence and exit to resolve the threat alarm.
    Type: Grant
    Filed: February 4, 2016
    Date of Patent: April 18, 2017
    Assignee: Rapiscan Systems, Inc.
    Inventors: Joseph Bendahan, Edward James Morton, David Yaish, Yossi Kolkovich, Jacques Goldberg
  • Patent number: 9562866
    Abstract: The present specification discloses a covert mobile inspection vehicle with a backscatter X-ray scanning system that has an X-ray source and detectors for obtaining a radiographic image of an object outside the vehicle. The system is configured to also simultaneously detect passive radiation. The systems preferably include at least one sensor for determining a distance from at least one of the detectors to points on the surface of the object being scanned, a processor for processing the obtained radiographic image by using the determined distance of the object to obtain an atomic number of each material contained in the object, and one or more sensors to obtain surveillance data from a predefined area surrounding the vehicle.
    Type: Grant
    Filed: November 3, 2014
    Date of Patent: February 7, 2017
    Assignee: Rapiscan Systems, Inc.
    Inventors: Edward James Morton, Joseph Bendahan
  • Patent number: 9557427
    Abstract: The present specification describes systems and methods for the simultaneous detection of radioactive materials such as neutrons, muons and gamma rays based on thin gap chamber technology. A thin-gap chamber (TGC) is disclosed having a thermal neutron absorber material, such as 10B4C or 10B8C, which interacts with neutrons to emit heavy particles. The heavy particles, in turn, interact with the gas present in chamber to produce ionization that is converted into a measurable signal. The TGC is embedded in a neutron moderating medium. The detector systems are fabricated from commercially available construction materials and are easy to manufacture at a reasonable cost when compared to conventional He-3 neutron detector systems.
    Type: Grant
    Filed: January 8, 2015
    Date of Patent: January 31, 2017
    Assignee: Rapiscan Systems, Inc.
    Inventors: Joseph Bendahan, Michael King
  • Publication number: 20160349397
    Abstract: The present invention is directed to an inspection system that has a radiation source, a detector array, an inspection region, and a processing unit, where the processing unit a) obtains a radiographic image, b) segments the radiographic image based on radiation attenuation or transmission, c) identifies at least one segmented area on the radiographic image, d) filters the at least one segmented area using at least one geometric filter, e) generates feature vectors using the filtered segmented area; and f) compares the feature vectors against predefined values to determine whether a high-atomic-number object is present.
    Type: Application
    Filed: December 12, 2013
    Publication date: December 1, 2016
    Applicant: Rapiscan Systems, Inc.
    Inventors: Robert A. Armistead, JR., William Chang, Edward D. Franco, Joseph Bendahan, Jolyon A. Browne
  • Patent number: 9442213
    Abstract: The present invention provides a multi-view X-ray inspection system. In one embodiment, a beam steering mechanism directs the electron beam from an X-ray source to multiple production targets which generate X-rays for scanning which are subsequently detected by a plurality of detectors to produce multiple image slices (views). The system is adapted for use in CT systems. In one embodiment of a CT system, an electron beam generated by a single radiation source is steered by an electron beam transport mechanism comprising at least two dipoles and a quadrupole on to a target arranged in an approximated arc. The inspection system, in any configuration, can be deployed inside a vehicle for use as a mobile detection system.
    Type: Grant
    Filed: May 6, 2014
    Date of Patent: September 13, 2016
    Assignee: Rapiscan Systems, Inc.
    Inventors: Joseph Bendahan, James Kevin Jones, Deepa Angal-Kalinin, Kiril Borisov Marinov
  • Patent number: 9435752
    Abstract: The present application discloses scanner systems that have a radiation generator arranged to generate radiation to irradiate an object, a detector arranged to detect the radiation after it has interacted with the object and generate a sequence of detector data sets as the object is moved relative to the generator, and processors arranged to process each of the detector data sets thereby to generate a control output.
    Type: Grant
    Filed: February 3, 2011
    Date of Patent: September 6, 2016
    Assignee: Rapiscan Systems, Inc.
    Inventors: Edward James Morton, Joseph Bendahan, Willem G. J. Langeveld