Patents by Inventor Joseph C. Marron

Joseph C. Marron has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8309900
    Abstract: A combined active and passive imaging system comprises a radiation sources configured to output radiation beams towards a detector and an object in a scene. The system further comprises the detector configured to record superposition of instances of intensity patterns of interferences between at least a portion of the radiation beams and at least a portion of return radiations from the object. The detector may further be configured to record ambient light reflected from the scene. The detector may output a first signal with the recorded ambient light reflected from the scene and a second signal with the recorded superposition. The system further comprises a processor communicatively coupled to the detector and the radiation source unit. The processor may receive the first signal and the second signal and select the object in the scene.
    Type: Grant
    Filed: May 15, 2012
    Date of Patent: November 13, 2012
    Assignee: Lockheed Martin Coherent Technologies, Inc
    Inventor: Joseph C. Marron
  • Patent number: 8227735
    Abstract: A combined active and passive imaging system comprises a radiation source unit configured to output a radiation beam towards a detector and an object in a scene. The system further comprises the detector configured to record a first instance of an intensity pattern of an interference between at least a portion of the radiation beam and at least a portion of a return radiation from the object. The detector may further be configured to record ambient light reflected from the scene. The detector may output a first signal with the recorded ambient light reflected from the scene and a second signal with the recorded intensity pattern. The system further comprises a processor communicatively coupled to the detector and the radiation source unit. The processor may receive the first signal and the second signal and select the object in the scene.
    Type: Grant
    Filed: February 20, 2009
    Date of Patent: July 24, 2012
    Assignee: Lockheed Martin Coherent Technologies, Inc.
    Inventor: Joseph C. Marron
  • Patent number: 8068235
    Abstract: Systems and methods are provided for multi-function coherent imaging comprising directing a first coherent radiation beam and a second coherent radiation beam towards a detector, where the second coherent radiation beam is spatially offset, angularly offset, or spatially and angularly offset from the first coherent radiation beam. A portion of the first coherent radiation beam and a portion of the second coherent radiation beam may be combined to form a composite beam. An object may be radiated with the composite beam. A first intensity pattern may be formed by interfering with return radiation from the radiated object with the first coherent radiation beam and a second intensity pattern is formed with the return radiation from the radiated object and the second coherent radiation beam. A detector may simultaneously record a superposition of the first intensity pattern and the second intensity pattern.
    Type: Grant
    Filed: July 24, 2007
    Date of Patent: November 29, 2011
    Assignee: Lockheed Martin Corporation
    Inventors: Joseph C. Marron, Richard L. Kendrick
  • Patent number: 7405834
    Abstract: An imaging method and associated system for producing high-resolution images. The method includes illuminating an object or scene with coherent radiation such as beams from a laser and then, collecting scattered light with a plurality of subapertures rather than a single large aperture. The method continues with coherently detecting, such as with heterodyne detection, the scattered light to measure the complex amplitude incident on each subaperture and digitally reconstructing images from the coherently detected light for the subapertures. Then digital co-phasing is performed on the subapertures using an image sharpness or quality metric to form an image having the resolution of the total subaperture area. The method may also include determining an aimpoint in the formed image, calculating a phase screen, directing laser beams through the subapertures towards the aimpoint, and co-phasing the laser beams by applying the phase screen to form a single beam.
    Type: Grant
    Filed: February 15, 2006
    Date of Patent: July 29, 2008
    Assignee: Lockheed Martin Corporation
    Inventors: Joseph C. Marron, Carl W. Embry, AnnMarie Oien, Duane D. Smith, J. Alex Thomson, James Pete Tucker, Samuel G. L. Williams
  • Patent number: 7268889
    Abstract: A frequency-shifting interferometer gathers intensity data from a set of interference patterns produced at different measuring beam frequencies. A periodic function is matched to the intensity data gathered from the set of interference patterns over a corresponding range of measuring beam frequencies. Localized correlations involving phase offsets between the interfering portions of the measuring beam are used to inform a determination of a rate of phase change with measuring beam frequency corresponding to the optical path length difference between the interfering beam portions.
    Type: Grant
    Filed: September 22, 2004
    Date of Patent: September 11, 2007
    Assignee: Corning Incorporated
    Inventors: Andrew Kulawiec, Joseph C. Marron, Don McClimans, Mark J. Tronolone
  • Patent number: 7268887
    Abstract: Two common-path interferometers share a measuring cavity for measuring opposite sides of opaque test parts. Interference patterns are formed between one side of the test parts and the reference surface of a first of the two interferometers, between the other side of the test parts and the reference surface of a second of the two interferometers, and between the first and second reference surfaces. The latter measurement between the reference surfaces of the two interferometers enables the measurements of the opposite sides of the test parts to be related to each other.
    Type: Grant
    Filed: December 23, 2004
    Date of Patent: September 11, 2007
    Assignee: Corning Incorporated
    Inventors: Andrew W. Kulawiec, Mark J. Tronolone, Thomas J. Dunn, Joseph C. Marron
  • Patent number: 7130059
    Abstract: Frequency-scanning interferometry is applied to common-path interferometers for measuring topographical features of test objects. A reference element located adjacent to a test object functions as both a beamsplitter and a reference surface. A first portion of a measuring beam reflects from the reference surface of the reference element as a reference beam, and a second portion of the measuring beam transmits through the reference element to and from a surface of the test object as an object beam. Both beams are conveyed along a common path to a detector that records a plurality of intensity variations produced by constructive and destructive interference between localized portions of the object and reference beams associated with different transverse coordinates on the test object surface.
    Type: Grant
    Filed: June 19, 2003
    Date of Patent: October 31, 2006
    Assignee: Light Gage, Inc
    Inventor: Joseph C. Marron
  • Patent number: 7057742
    Abstract: A frequency-scanning interferometer is modified to include a diffuse reference surface. An illuminating system produces an expanding measuring beam, portions of which reflect from a test object surface and the diffuse reference surface on converging paths to an imaging system. Interference patterns between overlapping images of the object and reference surfaces are generated at a plurality of frequencies for measuring the object surface with respect to the reference surface.
    Type: Grant
    Filed: June 30, 2003
    Date of Patent: June 6, 2006
    Assignee: Lightgage, Inc.
    Inventors: Joseph C. Marron, Dean Faklis
  • Patent number: 6882433
    Abstract: An expanding measuring beam is inserted into a cavity of a frequency-scanning interferometer. The expanding measuring beam encounters non-specular (diffuse) reference and object surfaces so that the reflected light can be imaged with an imaging system of reduced dimension. The compact interferometer is adaptable to a variety of applications. For example, the compact interferometer can be incorporated into a sensor of a multi-stage measuring instrument or into a handheld imager.
    Type: Grant
    Filed: June 30, 2003
    Date of Patent: April 19, 2005
    Assignee: Lightgage, Inc.
    Inventors: Joseph C. Marron, Dean Faklis
  • Patent number: 6741361
    Abstract: A system of frequency-scanning interferometry uses a computer system operating in accordance with a program for measuring distances or range, including measuring topographical information about test object surfaces. Interferometric data is detected using a single point detector or an array of such detectors and recorded (stored) in the computer system, and a series of measurements are taken over a range of illumination frequencies. The interferometric data varies in a sinusoidal manner with a change in illumination frequency at interference frequencies corresponding to particular measures of distance or range. A Fourier transform for locating peak interference frequencies is first limited in frequency space and second divided into stages to save processing time. A coarse spacing between Fourier frequency samples is used for a first approximation, and finer spacing between Fourier frequency samples are used in the vicinity of the first approximation to make a second more accurate approximation.
    Type: Grant
    Filed: June 23, 2003
    Date of Patent: May 25, 2004
    Assignee: LightGage, Inc.
    Inventor: Joseph C. Marron
  • Publication number: 20040075844
    Abstract: A frequency-scanning interferometer is modified to include a diffuse reference surface. An illuminating system produces an expanding measuring beam, portions of which reflect from a test object surface and the diffuse reference surface on converging paths to an imaging system. Interference patterns between overlapping images of the object and reference surfaces are generated at a plurality of frequencies for measuring the object surface with respect to the reference surface.
    Type: Application
    Filed: June 30, 2003
    Publication date: April 22, 2004
    Inventors: Joseph C. Marron, Dean Faklis
  • Publication number: 20040075843
    Abstract: An expanding measuring beam is inserted into a cavity of a frequency-scanning interferometer. The expanding measuring beam encounters non-specular (diffuse) reference and object surfaces so that the reflected light can be imaged with an imaging system of reduced dimension. The compact interferometer is adaptable to a variety of applications. For example, the compact interferometer can be incorporated into a sensor of a multi-stage measuring instrument or into a handheld imager.
    Type: Application
    Filed: June 30, 2003
    Publication date: April 22, 2004
    Inventors: Joseph C. Marron, Dean Faklis
  • Publication number: 20040066520
    Abstract: A system of frequency-scanning interterometry uses a computer system operating in accordance with a program for measuring distances or range, including measuring topographical information about test object surfaces. Interferometric data is detected using a single point detector or an array of such detectors and recorded (stored) in the computer system, and a series of measurements are taken over a range of illumination frequencies. The interferometric data varies in a sinusoidal manner with a change in illumination frequency at interference frequencies corresponding to particular measures of distance or range. A Fourier transform for locating peak interference frequencies is first limited in frequency space and second divided into stages to save processing time. A coarse spacing between Fourier frequency samples is used for a first approximation, and finer spacing between Fourier frequency samples are used in the vicinity of the first approximation to make a second more accurate approximation.
    Type: Application
    Filed: June 23, 2003
    Publication date: April 8, 2004
    Inventor: Joseph C. Marron
  • Patent number: 6690690
    Abstract: A wavelength tuning system adjusts an external cavity of a laser about two orthogonal axes for aligning features of a diffractive optic with a third orthogonal axis about which the diffractive optic is pivoted for providing selected wavelength feedback to the laser. A laser mount supports the laser, and a mounting arm supports both the diffractive optic and a reflective optic in a fixed orientation with respect to each other. A flexural member forms at least part of a connection between the mounting arm and the laser mount in a relative orientation for optically coupling the diffractive optic to the laser within the external cavity. The mounting arm is pivoted with respect to the laser mount about the pivot axis by an actuator for varying a wavelength of a diffracted portion of the output beam returned to the laser without significantly varying an angular orientation of the output beam with respect to the laser mount as reflected from the reflective optic.
    Type: Grant
    Filed: May 27, 2003
    Date of Patent: February 10, 2004
    Assignee: LightGage, Inc.
    Inventor: Joseph C. Marron
  • Publication number: 20030234936
    Abstract: Frequency-scanning interferometry is applied to common-path interferometers for measuring topographical features of test objects. A reference element located adjacent to a test object functions as both a beamsplitter and a reference surface. A first portion of a measuring beam reflects from the reference surface of the reference element as a reference beam, and a second portion of the measuring beam transmits through the reference element to and from a surface of the test object as an object beam. Both beams are conveyed along a common path to a detector that records a plurality of intensity variations produced by constructive and destructive interference between localized portions of the object and reference beams associated with different transverse coordinates on the test object surface.
    Type: Application
    Filed: June 19, 2003
    Publication date: December 25, 2003
    Inventor: Joseph C. Marron
  • Publication number: 20030231691
    Abstract: A wavelength tuning system adjusts an external cavity of a laser about two orthogonal axes for aligning features of a diffractive optic with a third orthogonal axis about which the diffractive optic is pivoted for providing selected wavelength feedback to the laser. A laser mount supports the laser, and a mounting arm supports both the diffractive optic and a reflective optic in a fixed orientation with respect to each other. A flexural member forms at least part of a connection between the mounting arm and the laser mount in a relative orientation for optically coupling the diffractive optic to the laser within the external cavity. The mounting arm is pivoted with respect to the laser mount about the pivot axis by an actuator for varying a wavelength of a diffracted portion of the output beam returned to the laser without significantly varying an angular orientation of the output beam with respect to the laser mount as reflected from the reflective optic.
    Type: Application
    Filed: May 27, 2003
    Publication date: December 18, 2003
    Inventor: Joseph C. Marron
  • Patent number: 5926277
    Abstract: A method for determining a range dimension of an object utilizing multiple wavelength interferometry to form an image of the object includes developing a discernible two-dimensional image from an interference pattern at selected points for each of a number of wavelengths, collecting complex values from the interference pattern and developing a phase value from the complex value, and determining a phase correction vector based on a difference between measured phase values and an ideal phase value associated with one or more reference points. The phase correction vector is used to correct each of the selected points. A one-dimensional Fourier transform is performed on the corrected values to yield a range profile for each selected point. A peak value is then determined from the range profile to determine the range dimension. The peak value may be determined based on a simple maximum, oversampling in selected areas prior to performing the Fourier transform, or using curve-fitting techniques.
    Type: Grant
    Filed: November 25, 1998
    Date of Patent: July 20, 1999
    Assignee: Erim International, Inc.
    Inventors: Joseph C. Marron, Kurt W. Gleichman
  • Patent number: 5907404
    Abstract: A system for interferometric inspection of an object includes a number of improvements to reduce spurious reflections and provide precision measurement of large objects. A neutral density filter of absorptive glass is used as an attenuator to reduce undesirable reflections which may otherwise result in detector saturation. A wedge-shaped beam splitter having at least one anti-reflective surface is also utilized to reduce unwanted reflections. The system uses multiple wavelength interferometry to provide range information for an object. Additional improvements in precision may be provided by using a wavelength calibration device such as an etalon, a wavemeter, or a reference cell having relatively narrow transmission peaks, to improve the accuracy in determining the laser wavelengths. The wavelength information may be used to more precisely determine range values for the object.
    Type: Grant
    Filed: September 8, 1997
    Date of Patent: May 25, 1999
    Assignee: ERIM International, Inc.
    Inventors: Joseph C. Marron, Kurt W. Gleichman
  • Patent number: 5880841
    Abstract: A method for determining a range dimension of an object utilizing multiple wavelength interferometry to form an image of the object includes developing a discernible two-dimensional image from an interference pattern at selected points for each of a number of wavelengths, collecting complex values from the interference pattern and developing a phase value from the complex value, and determining a phase correction vector based on a difference between measured phase values and an ideal phase value associated with one or more reference points. The phase correction vector is used to correct each of the selected points. A one-dimensional Fourier transform is performed on the corrected values to yield a range profile for each selected point. A peak value is then determined from the range profile to determine the range dimension. The peak value may be determined based on a simple maximum, oversampling in selected areas prior to performing the Fourier transform, or using curve-fitting techniques.
    Type: Grant
    Filed: September 8, 1997
    Date of Patent: March 9, 1999
    Assignee: Erim International, Inc.
    Inventors: Joseph C. Marron, Kurt W. Gleichman
  • Patent number: 5777742
    Abstract: A system and method for three-dimensional imaging utilize a lens to perform a two-dimensional Fourier transform of an interference pattern while focusing the pattern on a two-dimensional detector array which is positioned in the image plane of the lens. This allows immediate previewing of the imaged object for proper positioning. Coherent energy beams are utilized to create a series of interference patterns, or image-plane holograms, each at a different frequency of the source energy beams. Furthermore, at each frequency, the relative phase between an object and a reference energy beam is varied to capture the complex values associated with the interference patterns. After capturing and storing the various interference patterns, a computer performs a one-dimensional Fourier transform, or other simplified processing to generate the three-dimensional image of the object.
    Type: Grant
    Filed: February 4, 1994
    Date of Patent: July 7, 1998
    Assignee: Environmental Research Institute of Michigan
    Inventor: Joseph C. Marron